Particle measurement device, three-dimensional shape measurement device, detection device, particle measurement system, and particle measurement method
The invention provides a particle measurement device, a three-dimensional shape measurement device, a detection device, a particle measurement system, and a particle measurement method capable of managing the amount of generated particles. The present invention is provided with: an acquisition unit...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a particle measurement device, a three-dimensional shape measurement device, a detection device, a particle measurement system, and a particle measurement method capable of managing the amount of generated particles. The present invention is provided with: an acquisition unit (252) that acquires pad surface shape data indicating the surface shape of an electrode pad (P) including a probe trace touched by a probe (141); a detection unit (253) that detects, on the basis of the pad surface shape data, a pad reference surface (R) that is a reference for particle measurement; a concavo-convex calculation unit (254) that calculates, on the basis of the pad surface shape data, the volume (VMR) of a concave portion recessed from the pad reference surface (R) and the volume (VMP) of a convex portion protruding from the pad reference surface (R) in the surface shape of the electrode pad (P); and a particle generation amount calculation unit (255) that calculates a particle generation amount on th |
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