Microscope splicing calibration method based on image fusion

Microscope splicing calibration method based on image fusion

The invention discloses a microscope splicing calibration method based on image fusion. The method comprises the following steps: acquiring microscopic images between two adjacent frames at equal intervals; determining the ambiguity variation of a plurality of continuous adjacent microscopic images...

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Hauptverfasser: CHEN KAIXUAN, ZHANG MENG, LI HENG, SHEN HUA, CUI YUANCHI, LI CHENGWU, HAN SHUO
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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creator CHEN KAIXUAN
ZHANG MENG
LI HENG
SHEN HUA
CUI YUANCHI
LI CHENGWU
HAN SHUO
description The invention discloses a microscope splicing calibration method based on image fusion. The method comprises the following steps: acquiring microscopic images between two adjacent frames at equal intervals; determining the ambiguity variation of a plurality of continuous adjacent microscopic images along the same axial direction; obtaining the position coordinates of a key position point on the to-be-observed surface of the to-be-measured object under the coordinate system of the measurement platform; fitting a plane where the to-be-observed surface is located; analyzing the rotation angle and controlling the measurement platform to rotate; and splicing and fusing the overlapping areas of the two adjacent microscopic images. According to the invention, the rotation transformation model analyzes the rotation angle of the coordinate system of the to-be-observed surface to be converted into the coordinate system of the measurement platform, so as to adjust the rotation angle of the measurement platform, eliminat
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title Microscope splicing calibration method based on image fusion
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