Detection method and detection device for composite insulator
The invention relates to the technical field of defect detection, and provides a detection method and a detection device for a composite insulator. According to the method, the microwave signals are sent to the different positions of the surface of the defect-free composite insulator, the voltage si...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | XIA TIANLEI MA ZHENGUO ZHOU CHAOMIN HAO CHENYU DING YI HOU YANG ZHU LINGXIE WANG QING ZHU XIAOZHOU GAO JIAPING CHANG SHUAI |
| description | The invention relates to the technical field of defect detection, and provides a detection method and a detection device for a composite insulator. According to the method, the microwave signals are sent to the different positions of the surface of the defect-free composite insulator, the voltage signals corresponding to the reflected wave intensities of the different positions are obtained, the normal distribution characteristic values of the voltage signals are extracted based on the statistical principle, and the normalized matrix is constructed; the normalization matrix is used for carrying out normalization processing on the voltage signals at different positions of the composite insulator, and whether defects exist in the composite insulator or not is judged according to a normalization processing result, so that the defects of air gaps, carbonization, metallic conduction and the like in the composite insulator can be effectively detected, and the detection accuracy is improved. The method is suitable f |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116858861A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116858861A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116858861A3</originalsourceid><addsrcrecordid>eNrjZLB1SS1JTS7JzM9TyE0tychPUUjMS1FIgQumpJZlJqcqpOUXKSTn5xbkF2eWpCpk5hWX5iSW5BfxMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQzMLUwsLM0NHY2LUAABAmDCZ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Detection method and detection device for composite insulator</title><source>esp@cenet</source><creator>XIA TIANLEI ; MA ZHENGUO ; ZHOU CHAOMIN ; HAO CHENYU ; DING YI ; HOU YANG ; ZHU LINGXIE ; WANG QING ; ZHU XIAOZHOU ; GAO JIAPING ; CHANG SHUAI</creator><creatorcontrib>XIA TIANLEI ; MA ZHENGUO ; ZHOU CHAOMIN ; HAO CHENYU ; DING YI ; HOU YANG ; ZHU LINGXIE ; WANG QING ; ZHU XIAOZHOU ; GAO JIAPING ; CHANG SHUAI</creatorcontrib><description>The invention relates to the technical field of defect detection, and provides a detection method and a detection device for a composite insulator. According to the method, the microwave signals are sent to the different positions of the surface of the defect-free composite insulator, the voltage signals corresponding to the reflected wave intensities of the different positions are obtained, the normal distribution characteristic values of the voltage signals are extracted based on the statistical principle, and the normalized matrix is constructed; the normalization matrix is used for carrying out normalization processing on the voltage signals at different positions of the composite insulator, and whether defects exist in the composite insulator or not is judged according to a normalization processing result, so that the defects of air gaps, carbonization, metallic conduction and the like in the composite insulator can be effectively detected, and the detection accuracy is improved. The method is suitable f</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231010&DB=EPODOC&CC=CN&NR=116858861A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231010&DB=EPODOC&CC=CN&NR=116858861A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIA TIANLEI</creatorcontrib><creatorcontrib>MA ZHENGUO</creatorcontrib><creatorcontrib>ZHOU CHAOMIN</creatorcontrib><creatorcontrib>HAO CHENYU</creatorcontrib><creatorcontrib>DING YI</creatorcontrib><creatorcontrib>HOU YANG</creatorcontrib><creatorcontrib>ZHU LINGXIE</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHU XIAOZHOU</creatorcontrib><creatorcontrib>GAO JIAPING</creatorcontrib><creatorcontrib>CHANG SHUAI</creatorcontrib><title>Detection method and detection device for composite insulator</title><description>The invention relates to the technical field of defect detection, and provides a detection method and a detection device for a composite insulator. According to the method, the microwave signals are sent to the different positions of the surface of the defect-free composite insulator, the voltage signals corresponding to the reflected wave intensities of the different positions are obtained, the normal distribution characteristic values of the voltage signals are extracted based on the statistical principle, and the normalized matrix is constructed; the normalization matrix is used for carrying out normalization processing on the voltage signals at different positions of the composite insulator, and whether defects exist in the composite insulator or not is judged according to a normalization processing result, so that the defects of air gaps, carbonization, metallic conduction and the like in the composite insulator can be effectively detected, and the detection accuracy is improved. The method is suitable f</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB1SS1JTS7JzM9TyE0tychPUUjMS1FIgQumpJZlJqcqpOUXKSTn5xbkF2eWpCpk5hWX5iSW5BfxMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQzMLUwsLM0NHY2LUAABAmDCZ</recordid><startdate>20231010</startdate><enddate>20231010</enddate><creator>XIA TIANLEI</creator><creator>MA ZHENGUO</creator><creator>ZHOU CHAOMIN</creator><creator>HAO CHENYU</creator><creator>DING YI</creator><creator>HOU YANG</creator><creator>ZHU LINGXIE</creator><creator>WANG QING</creator><creator>ZHU XIAOZHOU</creator><creator>GAO JIAPING</creator><creator>CHANG SHUAI</creator><scope>EVB</scope></search><sort><creationdate>20231010</creationdate><title>Detection method and detection device for composite insulator</title><author>XIA TIANLEI ; MA ZHENGUO ; ZHOU CHAOMIN ; HAO CHENYU ; DING YI ; HOU YANG ; ZHU LINGXIE ; WANG QING ; ZHU XIAOZHOU ; GAO JIAPING ; CHANG SHUAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116858861A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIA TIANLEI</creatorcontrib><creatorcontrib>MA ZHENGUO</creatorcontrib><creatorcontrib>ZHOU CHAOMIN</creatorcontrib><creatorcontrib>HAO CHENYU</creatorcontrib><creatorcontrib>DING YI</creatorcontrib><creatorcontrib>HOU YANG</creatorcontrib><creatorcontrib>ZHU LINGXIE</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHU XIAOZHOU</creatorcontrib><creatorcontrib>GAO JIAPING</creatorcontrib><creatorcontrib>CHANG SHUAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIA TIANLEI</au><au>MA ZHENGUO</au><au>ZHOU CHAOMIN</au><au>HAO CHENYU</au><au>DING YI</au><au>HOU YANG</au><au>ZHU LINGXIE</au><au>WANG QING</au><au>ZHU XIAOZHOU</au><au>GAO JIAPING</au><au>CHANG SHUAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detection method and detection device for composite insulator</title><date>2023-10-10</date><risdate>2023</risdate><abstract>The invention relates to the technical field of defect detection, and provides a detection method and a detection device for a composite insulator. According to the method, the microwave signals are sent to the different positions of the surface of the defect-free composite insulator, the voltage signals corresponding to the reflected wave intensities of the different positions are obtained, the normal distribution characteristic values of the voltage signals are extracted based on the statistical principle, and the normalized matrix is constructed; the normalization matrix is used for carrying out normalization processing on the voltage signals at different positions of the composite insulator, and whether defects exist in the composite insulator or not is judged according to a normalization processing result, so that the defects of air gaps, carbonization, metallic conduction and the like in the composite insulator can be effectively detected, and the detection accuracy is improved. The method is suitable f</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN116858861A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Detection method and detection device for composite insulator |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T01%3A45%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XIA%20TIANLEI&rft.date=2023-10-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116858861A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |