Semiconductor test probe for via detection
The invention discloses a semiconductor test probe for channel detection, which comprises a right-angle needle tube, a transmission needle is slidably arranged in one end of the right-angle needle tube, a test needle is slidably arranged in the other end of the right-angle needle tube, and the test...
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| creator | ZHANG FEILONG DING CHONGLIANG |
| description | The invention discloses a semiconductor test probe for channel detection, which comprises a right-angle needle tube, a transmission needle is slidably arranged in one end of the right-angle needle tube, a test needle is slidably arranged in the other end of the right-angle needle tube, and the test needle and the transmission needle are hinged together through a guide rod. The semiconductor test probe for path detection solves the problem that when a contact of a test element and a contact of a detection instrument are arranged at an angle of 90 degrees, connection between the test element and the detection instrument is difficult to complete by using an existing probe for testing.
本发明公开了一种用于通路检测的半导体测试探针，包括直角针管，所述直角针管的一端中可滑动地设置有传输针，直角针管的另一端中可滑动地设置有测试针，所述测试针和传输针通过导杆铰接在一起。该用于通路检测的半导体测试探针，解决了测试元件的触点和检测仪器的触点呈90°布置的时候使用现有探针进行测试就难以完成两者之间连接的问题。 |
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本发明公开了一种用于通路检测的半导体测试探针，包括直角针管，所述直角针管的一端中可滑动地设置有传输针，直角针管的另一端中可滑动地设置有测试针，所述测试针和传输针通过导杆铰接在一起。该用于通路检测的半导体测试探针，解决了测试元件的触点和检测仪器的触点呈90°布置的时候使用现有探针进行测试就难以完成两者之间连接的问题。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230915&DB=EPODOC&CC=CN&NR=116754813A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230915&DB=EPODOC&CC=CN&NR=116754813A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG FEILONG</creatorcontrib><creatorcontrib>DING CHONGLIANG</creatorcontrib><title>Semiconductor test probe for via detection</title><description>The invention discloses a semiconductor test probe for channel detection, which comprises a right-angle needle tube, a transmission needle is slidably arranged in one end of the right-angle needle tube, a test needle is slidably arranged in the other end of the right-angle needle tube, and the test needle and the transmission needle are hinged together through a guide rod. The semiconductor test probe for path detection solves the problem that when a contact of a test element and a contact of a detection instrument are arranged at an angle of 90 degrees, connection between the test element and the detection instrument is difficult to complete by using an existing probe for testing.
本发明公开了一种用于通路检测的半导体测试探针，包括直角针管，所述直角针管的一端中可滑动地设置有传输针，直角针管的另一端中可滑动地设置有测试针，所述测试针和传输针通过导杆铰接在一起。该用于通路检测的半导体测试探针，解决了测试元件的触点和检测仪器的触点呈90°布置的时候使用现有探针进行测试就难以完成两者之间连接的问题。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAKTs3NTM7PSylNLskvUihJLS5RKCjKT0pVSANyyzITFVJSS1KTSzLz83gYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbyzn6GhmbmpiYWhsaMxMWoARZIpNg</recordid><startdate>20230915</startdate><enddate>20230915</enddate><creator>ZHANG FEILONG</creator><creator>DING CHONGLIANG</creator><scope>EVB</scope></search><sort><creationdate>20230915</creationdate><title>Semiconductor test probe for via detection</title><author>ZHANG FEILONG ; DING CHONGLIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116754813A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG FEILONG</creatorcontrib><creatorcontrib>DING CHONGLIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG FEILONG</au><au>DING CHONGLIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor test probe for via detection</title><date>2023-09-15</date><risdate>2023</risdate><abstract>The invention discloses a semiconductor test probe for channel detection, which comprises a right-angle needle tube, a transmission needle is slidably arranged in one end of the right-angle needle tube, a test needle is slidably arranged in the other end of the right-angle needle tube, and the test needle and the transmission needle are hinged together through a guide rod. The semiconductor test probe for path detection solves the problem that when a contact of a test element and a contact of a detection instrument are arranged at an angle of 90 degrees, connection between the test element and the detection instrument is difficult to complete by using an existing probe for testing.
本发明公开了一种用于通路检测的半导体测试探针，包括直角针管，所述直角针管的一端中可滑动地设置有传输针，直角针管的另一端中可滑动地设置有测试针，所述测试针和传输针通过导杆铰接在一起。该用于通路检测的半导体测试探针，解决了测试元件的触点和检测仪器的触点呈90°布置的时候使用现有探针进行测试就难以完成两者之间连接的问题。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Semiconductor test probe for via detection |
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