Multi-node regression test method and device, medium and electronic equipment

Multi-node regression test method and device, medium and electronic equipment

The invention provides a multi-node regression test method and device, a medium and electronic equipment. The multi-node regression test method comprises the following steps: acquiring a simulation test case set of a to-be-verified chip; based on node verification modes and the simulation test case...

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1. Verfasser: ZHAO GUANGHAO
Format: Patent
Sprache:chi ; eng
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CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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description The invention provides a multi-node regression test method and device, a medium and electronic equipment. The multi-node regression test method comprises the following steps: acquiring a simulation test case set of a to-be-verified chip; based on node verification modes and the simulation test case set of the to-be-verified chip, obtaining simulation test case sets on a plurality of machine nodes, the node verification modes being working modes in which the machine nodes verify the simulation test case set of the to-be-verified chip, and the node verification modes having at least two types; the simulation test case set on the machine node is verified through the multiple threads of the machine node so as to obtain a verification report of the simulation test case set on the machine node, and the verification report and the simulation test case set on the machine node are both stored in a shared area between the machine nodes. Compared with a traditional verification method, the verification efficiency of the
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Multi-node regression test method and device, medium and electronic equipment
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