Device and method for measuring birefringence phase difference of intelligent microscopic imaging crystal

Device and method for measuring birefringence phase difference of intelligent microscopic imaging crystal

The invention relates to an intelligent microscopic imaging crystal birefringence phase difference measuring device and method, the device comprises a measuring device main body, a laser light source part and an acquisition part, linear polarization laser emitted by the laser light source part passe...

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Hauptverfasser: GU TINGWEI, JIANG HANLIN, XU WEIXIAO, YANG XUEZONG, SUN YUXIANG, YANG XUN, MA XIANGZE, LI MUYE
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator GU TINGWEI
JIANG HANLIN
XU WEIXIAO
YANG XUEZONG
SUN YUXIANG
YANG XUN
MA XIANGZE
LI MUYE
description The invention relates to an intelligent microscopic imaging crystal birefringence phase difference measuring device and method, the device comprises a measuring device main body, a laser light source part and an acquisition part, linear polarization laser emitted by the laser light source part passes through the measuring device main body, and a rotary stepping motor changes the linear polarization direction of a laser light source; the light intensity of linearly polarized laser in different directions is modulated by using the birefringence effect of the crystal, and the birefringence characteristic of the crystal is calculated by collecting a plurality of light intensity distribution diagrams of the laser modulated by the birefringence of the crystal in different linear polarization directions. According to the device and the method for measuring the birefringence phase difference of the intelligent microscopic imaging crystal, the birefringence information of the crystal is represented through the change
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Device and method for measuring birefringence phase difference of intelligent microscopic imaging crystal
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