Electronic cantilever beam impact testing machine
The invention relates to the technical field of cantilever beam impact testing machines, in particular to an electronic cantilever beam impact testing machine which comprises a base, a mounting plate is fixedly connected to the top of the base, protective plates are fixedly connected to the two side...
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| creator | LI YONGLIANG ZENG GUOYUAN LI HAIBIN |
| description | The invention relates to the technical field of cantilever beam impact testing machines, in particular to an electronic cantilever beam impact testing machine which comprises a base, a mounting plate is fixedly connected to the top of the base, protective plates are fixedly connected to the two sides of the mounting plate, transparent baffles are hinged to the surfaces of the two protective plates, and the transparent baffles are fixedly connected to the two sides of the mounting plate. The side, close to the transparent baffle, of the mounting plate is fixedly connected with a connecting arm; by arranging the reset structure, under the action of the reset structure, after a sample is subjected to an impact test for the first time, the driving motor is started to drive the rotating plate to rotate, so that the pendulum bob can be driven to automatically reset under the action of the push block and is matched with the limiting structure to limit the pendulum bob; the condition that a user needs to reset the po |
| format | Patent |
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The side, close to the transparent baffle, of the mounting plate is fixedly connected with a connecting arm; by arranging the reset structure, under the action of the reset structure, after a sample is subjected to an impact test for the first time, the driving motor is started to drive the rotating plate to rotate, so that the pendulum bob can be driven to automatically reset under the action of the push block and is matched with the limiting structure to limit the pendulum bob; the condition that a user needs to reset the po</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230829&DB=EPODOC&CC=CN&NR=116660007A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230829&DB=EPODOC&CC=CN&NR=116660007A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LI YONGLIANG</creatorcontrib><creatorcontrib>ZENG GUOYUAN</creatorcontrib><creatorcontrib>LI HAIBIN</creatorcontrib><title>Electronic cantilever beam impact testing machine</title><description>The invention relates to the technical field of cantilever beam impact testing machines, in particular to an electronic cantilever beam impact testing machine which comprises a base, a mounting plate is fixedly connected to the top of the base, protective plates are fixedly connected to the two sides of the mounting plate, transparent baffles are hinged to the surfaces of the two protective plates, and the transparent baffles are fixedly connected to the two sides of the mounting plate. 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| language | chi ; eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Electronic cantilever beam impact testing machine |
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