Diffraction sensor for detecting binding affinity
The invention provides a diffraction sensor (1) comprising: a substrate (3); -two interdigital affinity gratings (2), a first affinity grating (20) comprising a first unit cell (200) having an affinity element (201), and a second affinity grating (21) comprising a second unit cell (210) having an af...
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| creator | VOLOS JANOS REICHMUTH ANDREAS MICHAEL BLICKENSTORFER, YVES LUCAS FATTIGER, CHRISTOPH FRUTIGER, ANDREAS POPOV ROMAN |
| description | The invention provides a diffraction sensor (1) comprising: a substrate (3); -two interdigital affinity gratings (2), a first affinity grating (20) comprising a first unit cell (200) having an affinity element (201), and a second affinity grating (21) comprising a second unit cell (210) having an affinity element (211), wherein the first unit cell (200) and the second unit cell (210) are configured and arranged such that coherent light of a predetermined wavelength generated at a predetermined beam generation location (40) and diffracted by target molecules (204, 214) bound to the affinity elements (201, 211) constructively interferes in opposite phases at a predetermined detection location (50), and wherein the first affinity grating (20) and the second affinity grating (21) are balanced to generate a bias signal at the predetermined detection position (50), the bias signal corresponding to a difference ([Delta] m) in scattering masses of the first affinity grating (20) and the second affinity grating (21), |
| format | Patent |
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-two interdigital affinity gratings (2), a first affinity grating (20) comprising a first unit cell (200) having an affinity element (201), and a second affinity grating (21) comprising a second unit cell (210) having an affinity element (211), wherein the first unit cell (200) and the second unit cell (210) are configured and arranged such that coherent light of a predetermined wavelength generated at a predetermined beam generation location (40) and diffracted by target molecules (204, 214) bound to the affinity elements (201, 211) constructively interferes in opposite phases at a predetermined detection location (50), and wherein the first affinity grating (20) and the second affinity grating (21) are balanced to generate a bias signal at the predetermined detection position (50), the bias signal corresponding to a difference ([Delta] m) in scattering masses of the first affinity grating (20) and the second affinity grating (21),</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; 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-two interdigital affinity gratings (2), a first affinity grating (20) comprising a first unit cell (200) having an affinity element (201), and a second affinity grating (21) comprising a second unit cell (210) having an affinity element (211), wherein the first unit cell (200) and the second unit cell (210) are configured and arranged such that coherent light of a predetermined wavelength generated at a predetermined beam generation location (40) and diffracted by target molecules (204, 214) bound to the affinity elements (201, 211) constructively interferes in opposite phases at a predetermined detection location (50), and wherein the first affinity grating (20) and the second affinity grating (21) are balanced to generate a bias signal at the predetermined detection position (50), the bias signal corresponding to a difference ([Delta] m) in scattering masses of the first affinity grating (20) and the second affinity grating (21),</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0yUxLK0pMLsnMz1MoTs0rzi9SSAPilNSSVKBgXrpCUmZeCohOTEvLzMssqeRhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGZmYmFmaGpo7GxKgBALJdK_o</recordid><startdate>20230825</startdate><enddate>20230825</enddate><creator>VOLOS JANOS</creator><creator>REICHMUTH ANDREAS MICHAEL</creator><creator>BLICKENSTORFER, YVES LUCAS</creator><creator>FATTIGER, CHRISTOPH</creator><creator>FRUTIGER, ANDREAS</creator><creator>POPOV ROMAN</creator><scope>EVB</scope></search><sort><creationdate>20230825</creationdate><title>Diffraction sensor for detecting binding affinity</title><author>VOLOS JANOS ; 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| title | Diffraction sensor for detecting binding affinity |
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