Defect detection method, electronic equipment and storage medium

The invention relates to the technical field of flaw detection, and provides a flaw detection method, electronic equipment and a storage medium. The flaw detection method comprises the following steps: inputting a target image into a pre-trained first classification model to obtain a first classific...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIN ZECHENG, WU YANGZHEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
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