Semiconductor laser element, semiconductor laser device, method for manufacturing semiconductor laser device, and gas analyzer

Semiconductor laser element, semiconductor laser device, method for manufacturing semiconductor laser device, and gas analyzer

The invention provides a semiconductor laser element, a semiconductor laser device, a method for manufacturing the same, and a gas analyzer. A distributed feedback type semiconductor laser element (3) has a diffraction grating (3M) formed on a waveguide (3L), stably outputs single-mode light, and in...

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Hauptverfasser: AWANE YUSUKE, TERAKADO TOMOJI, MATSUHAMA MAKOTO
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator AWANE YUSUKE
TERAKADO TOMOJI
MATSUHAMA MAKOTO
description The invention provides a semiconductor laser element, a semiconductor laser device, a method for manufacturing the same, and a gas analyzer. A distributed feedback type semiconductor laser element (3) has a diffraction grating (3M) formed on a waveguide (3L), stably outputs single-mode light, and increases the intensity of the light. The waveguide (3L) is provided with: a diffraction grating section (301) in which a diffraction grating (3M) is formed; and a flat section (302) having a region in which the diffraction grating (301) is not formed and which is wider than the diffraction grating section (301). The flat portion (302) has a connection portion (303), the connection portion (303) has a region in which the width continuously changes as the connection portion (303) faces a connection site with the diffraction grating portion (301), a high reflective film (HR) is provided on an end surface of the flat portion (302) on the opposite side to the connection portion (303), and a low reflective film (AR) is pr
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Semiconductor laser element, semiconductor laser device, method for manufacturing semiconductor laser device, and gas analyzer
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