MEASUREMENT DEVICE AND CONTROL DEVICE

The invention provides a measurement device and a control device, which can easily obtain information with high precision compared with the situation that information related to a region irradiated with light is obtained only according to the result that light emitted from a light-emitting section c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KEI TAKEYAMA, OI KAHO, SHIRAISHI EMIKO, HAYAKAWA JUNICHIRO, MORITA YOHEI
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention provides a measurement device and a control device, which can easily obtain information with high precision compared with the situation that information related to a region irradiated with light is obtained only according to the result that light emitted from a light-emitting section corresponding to a light-receiving section is reflected and received by the light-receiving section, and the measurement device and the control device can easily obtain information with high precision compared with the situation that the information related to the region irradiated with the light is obtained only according to the result. This measurement device is provided with: a light-emitting unit that includes a first light-emitting section for emitting light toward a first region, and a second light-emitting section for emitting light toward a second region different from the first region; a light-receiving unit including a first light-receiving section that receives light reflected by the first region and a se