Device and method for measuring bending condition of pointer type bending limiter
The invention provides a device and method for measuring the bending condition of a pointer type bending limiter, and the device comprises a measurement pointer which is disposed at a position, where the bending condition needs to be measured, of the bending limiter; the drawing plate is arranged in...
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| creator | ZHANG CONG YANG JIANYE DING LESHENG CHEN JINLONG LU ZHAOKUAN MAO YANDONG |
| description | The invention provides a device and method for measuring the bending condition of a pointer type bending limiter, and the device comprises a measurement pointer which is disposed at a position, where the bending condition needs to be measured, of the bending limiter; the drawing plate is arranged in an area where the measuring pointer possibly passes through in the measuring process; the fixing device is connected with the fixed end of the bending limiter; the stretching device is connected with the free end of the bending limiter, and the free end of the bending limiter is driven by the stretching device to move, so that the bending limiter generates bending deformation; according to the device and the method for measuring the bending condition of the pointer type bending limiter, the bending conditions of the bending limiter in two directions in the plane parallel to the drawing plate can be obtained at the same time, and the measurement process is simple to operate and easy to implement.
本发明提供了一种指针式限弯器弯曲情况 |
| format | Patent |
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本发明提供了一种指针式限弯器弯曲情况</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAh0SS3LTE5VSMxLUchNLcnIT1FIyy8CMhOLS4sy89IVklLzUkB0cj6QLsnMz1PIT1MoyM_MK0ktUiipLEiFq8jJzM0ECvIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDMxMzUyNzS0djYtQAAMyZN8M</recordid><startdate>20230721</startdate><enddate>20230721</enddate><creator>ZHANG CONG</creator><creator>YANG JIANYE</creator><creator>DING LESHENG</creator><creator>CHEN JINLONG</creator><creator>LU ZHAOKUAN</creator><creator>MAO YANDONG</creator><scope>EVB</scope></search><sort><creationdate>20230721</creationdate><title>Device and method for measuring bending condition of pointer type bending limiter</title><author>ZHANG CONG ; YANG JIANYE ; DING LESHENG ; CHEN JINLONG ; LU ZHAOKUAN ; MAO YANDONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116465279A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG CONG</creatorcontrib><creatorcontrib>YANG JIANYE</creatorcontrib><creatorcontrib>DING LESHENG</creatorcontrib><creatorcontrib>CHEN JINLONG</creatorcontrib><creatorcontrib>LU ZHAOKUAN</creatorcontrib><creatorcontrib>MAO YANDONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG CONG</au><au>YANG JIANYE</au><au>DING LESHENG</au><au>CHEN JINLONG</au><au>LU ZHAOKUAN</au><au>MAO YANDONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device and method for measuring bending condition of pointer type bending limiter</title><date>2023-07-21</date><risdate>2023</risdate><abstract>The invention provides a device and method for measuring the bending condition of a pointer type bending limiter, and the device comprises a measurement pointer which is disposed at a position, where the bending condition needs to be measured, of the bending limiter; the drawing plate is arranged in an area where the measuring pointer possibly passes through in the measuring process; the fixing device is connected with the fixed end of the bending limiter; the stretching device is connected with the free end of the bending limiter, and the free end of the bending limiter is driven by the stretching device to move, so that the bending limiter generates bending deformation; according to the device and the method for measuring the bending condition of the pointer type bending limiter, the bending conditions of the bending limiter in two directions in the plane parallel to the drawing plate can be obtained at the same time, and the measurement process is simple to operate and easy to implement.
本发明提供了一种指针式限弯器弯曲情况</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Device and method for measuring bending condition of pointer type bending limiter |
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