Cone-beam X-ray fluorescence CT geometric parameter correction method and system

The invention is suitable for the technical field of CT imaging, and provides a cone-beam X-ray fluorescence CT geometric parameter correction method and system, and the method comprises the following steps: building a cone-beam X-ray fluorescence CT simulation model, and obtaining X-ray fluorescenc...

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Hauptverfasser: SHI SHENGHUI, LUO BINBIN, ZOU XUE, JIANG SHANGHAI, LI XIANGPENG, ZHAO MINGFU, TANG BIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention is suitable for the technical field of CT imaging, and provides a cone-beam X-ray fluorescence CT geometric parameter correction method and system, and the method comprises the following steps: building a cone-beam X-ray fluorescence CT simulation model, and obtaining X-ray fluorescence spectrum data; analyzing and processing the X-ray fluorescence spectrum data to obtain original projection data of the X-ray fluorescence CT; according to the projection data obtained by Monte Carlo simulation, using a reconstruction algorithm to carry out image reconstruction on the original projection data; densely sampling the offset parameters of the reconstructed image in the error domain of the offset parameters, and calculating the local linear relation between the re-projection data and the original projection data and the re-projection data by using the ideal projection matrix so as to correct the offset parameters; and performing geometric correction based on a local linear relationship between the re-p