Cone-beam X-ray fluorescence CT geometric parameter correction method and system
The invention is suitable for the technical field of CT imaging, and provides a cone-beam X-ray fluorescence CT geometric parameter correction method and system, and the method comprises the following steps: building a cone-beam X-ray fluorescence CT simulation model, and obtaining X-ray fluorescenc...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention is suitable for the technical field of CT imaging, and provides a cone-beam X-ray fluorescence CT geometric parameter correction method and system, and the method comprises the following steps: building a cone-beam X-ray fluorescence CT simulation model, and obtaining X-ray fluorescence spectrum data; analyzing and processing the X-ray fluorescence spectrum data to obtain original projection data of the X-ray fluorescence CT; according to the projection data obtained by Monte Carlo simulation, using a reconstruction algorithm to carry out image reconstruction on the original projection data; densely sampling the offset parameters of the reconstructed image in the error domain of the offset parameters, and calculating the local linear relation between the re-projection data and the original projection data and the re-projection data by using the ideal projection matrix so as to correct the offset parameters; and performing geometric correction based on a local linear relationship between the re-p |
---|