Self-calibration of reference voltage drop in digital-to-analog converters

A method for self-calibration of a reference voltage drop in a digital-to-analog converter (DAC) includes measuring each of a plurality of thermometric weights associated with a respective thermometric bit of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits a...

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Hauptverfasser: TRIVEDI RONAK PRAKASH CHANDRA, WONG SEE FAI, XING HANQING, PALADUGU RANGA SESHU, LE JEAN CAUXUAN
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creator TRIVEDI RONAK PRAKASH CHANDRA
WONG SEE FAI
XING HANQING
PALADUGU RANGA SESHU
LE JEAN CAUXUAN
description A method for self-calibration of a reference voltage drop in a digital-to-analog converter (DAC) includes measuring each of a plurality of thermometric weights associated with a respective thermometric bit of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing thermometric bit setting combination comprising at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, the following steps are performed: determining a weight correction for the respective combination; adding the weight correction of the combination to the highest order of the temperature measurement bit setting combination; and progressively increasing the number of bits of the thermometric bit setting combination in response to the number of bits of the sequential combination being less than the total number of the plurality of thermometric bits. 一种用于数模转换器(DAC)中的参考电压降的自校准
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116436462A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116436462A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116436462A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQBuAsDqK-w_kAGWpLdikVcXDRvZzpnxIIuXAJfX4XH8DpW769ebyQgvWc4ke5RckkgRQBiuxBm6TGK2hRKRQzLXGNjZNtYjlzkpW85A3aoPVodoFTxennwZxv03u8WxSZUQt7ZLR5fHadG3o3uMu1_-d8ASU_NSw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Self-calibration of reference voltage drop in digital-to-analog converters</title><source>esp@cenet</source><creator>TRIVEDI RONAK PRAKASH CHANDRA ; WONG SEE FAI ; XING HANQING ; PALADUGU RANGA SESHU ; LE JEAN CAUXUAN</creator><creatorcontrib>TRIVEDI RONAK PRAKASH CHANDRA ; WONG SEE FAI ; XING HANQING ; PALADUGU RANGA SESHU ; LE JEAN CAUXUAN</creatorcontrib><description>A method for self-calibration of a reference voltage drop in a digital-to-analog converter (DAC) includes measuring each of a plurality of thermometric weights associated with a respective thermometric bit of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing thermometric bit setting combination comprising at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, the following steps are performed: determining a weight correction for the respective combination; adding the weight correction of the combination to the highest order of the temperature measurement bit setting combination; and progressively increasing the number of bits of the thermometric bit setting combination in response to the number of bits of the sequential combination being less than the total number of the plurality of thermometric bits. 一种用于数模转换器(DAC)中的参考电压降的自校准</description><language>chi ; eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230714&amp;DB=EPODOC&amp;CC=CN&amp;NR=116436462A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230714&amp;DB=EPODOC&amp;CC=CN&amp;NR=116436462A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TRIVEDI RONAK PRAKASH CHANDRA</creatorcontrib><creatorcontrib>WONG SEE FAI</creatorcontrib><creatorcontrib>XING HANQING</creatorcontrib><creatorcontrib>PALADUGU RANGA SESHU</creatorcontrib><creatorcontrib>LE JEAN CAUXUAN</creatorcontrib><title>Self-calibration of reference voltage drop in digital-to-analog converters</title><description>A method for self-calibration of a reference voltage drop in a digital-to-analog converter (DAC) includes measuring each of a plurality of thermometric weights associated with a respective thermometric bit of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing thermometric bit setting combination comprising at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, the following steps are performed: determining a weight correction for the respective combination; adding the weight correction of the combination to the highest order of the temperature measurement bit setting combination; and progressively increasing the number of bits of the thermometric bit setting combination in response to the number of bits of the sequential combination being less than the total number of the plurality of thermometric bits. 一种用于数模转换器(DAC)中的参考电压降的自校准</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQBuAsDqK-w_kAGWpLdikVcXDRvZzpnxIIuXAJfX4XH8DpW769ebyQgvWc4ke5RckkgRQBiuxBm6TGK2hRKRQzLXGNjZNtYjlzkpW85A3aoPVodoFTxennwZxv03u8WxSZUQt7ZLR5fHadG3o3uMu1_-d8ASU_NSw</recordid><startdate>20230714</startdate><enddate>20230714</enddate><creator>TRIVEDI RONAK PRAKASH CHANDRA</creator><creator>WONG SEE FAI</creator><creator>XING HANQING</creator><creator>PALADUGU RANGA SESHU</creator><creator>LE JEAN CAUXUAN</creator><scope>EVB</scope></search><sort><creationdate>20230714</creationdate><title>Self-calibration of reference voltage drop in digital-to-analog converters</title><author>TRIVEDI RONAK PRAKASH CHANDRA ; WONG SEE FAI ; XING HANQING ; PALADUGU RANGA SESHU ; LE JEAN CAUXUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116436462A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>TRIVEDI RONAK PRAKASH CHANDRA</creatorcontrib><creatorcontrib>WONG SEE FAI</creatorcontrib><creatorcontrib>XING HANQING</creatorcontrib><creatorcontrib>PALADUGU RANGA SESHU</creatorcontrib><creatorcontrib>LE JEAN CAUXUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TRIVEDI RONAK PRAKASH CHANDRA</au><au>WONG SEE FAI</au><au>XING HANQING</au><au>PALADUGU RANGA SESHU</au><au>LE JEAN CAUXUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Self-calibration of reference voltage drop in digital-to-analog converters</title><date>2023-07-14</date><risdate>2023</risdate><abstract>A method for self-calibration of a reference voltage drop in a digital-to-analog converter (DAC) includes measuring each of a plurality of thermometric weights associated with a respective thermometric bit of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing thermometric bit setting combination comprising at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, the following steps are performed: determining a weight correction for the respective combination; adding the weight correction of the combination to the highest order of the temperature measurement bit setting combination; and progressively increasing the number of bits of the thermometric bit setting combination in response to the number of bits of the sequential combination being less than the total number of the plurality of thermometric bits. 一种用于数模转换器(DAC)中的参考电压降的自校准</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
title Self-calibration of reference voltage drop in digital-to-analog converters
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