High formwork deformation monitoring method and system and storage medium

The invention relates to the technical field of high-formwork deformation monitoring, in particular to a high-formwork deformation monitoring method and system and a storage medium, and the high-formwork deformation monitoring method comprises the following steps: obtaining to-be-monitored high-form...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIU HANHUA, GUO SHEN, ZHU JUNPING, CAO DIANHUA, LI SHUHONG, SHUAI HONGXUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!