Material surface dust removal and detection system, method and application thereof

The invention relates to the technical field of electronic product appearance defect detection, in particular to a material surface dust removal and detection system and method. The dust removal and detection method is realized based on a material surface dust removal device and an area array detect...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YANG JEONG-NAM, WANG MENGZHE, LAI MIANLI, LI ENQUAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!