Pole piece impedance testing device and consistency judgment method
The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n di...
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creator | SHI YIHAN SHI XIAOZE SHAO QI LIU SHIQI LIAO SHAOJIE |
description | The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized.
一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。 |
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一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230630&DB=EPODOC&CC=CN&NR=116359768A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230630&DB=EPODOC&CC=CN&NR=116359768A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHI YIHAN</creatorcontrib><creatorcontrib>SHI XIAOZE</creatorcontrib><creatorcontrib>SHAO QI</creatorcontrib><creatorcontrib>LIU SHIQI</creatorcontrib><creatorcontrib>LIAO SHAOJIE</creatorcontrib><title>Pole piece impedance testing device and consistency judgment method</title><description>The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized.
一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOyM9JVSjITE1OVcjMLUhNScwDskpSi0sy89IVUlLLMoHcxLwUheT8vOLM4pLUvORKhazSlPTc1LwShdzUkoz8FB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEu_sZ2hoZmxqaW5m4WhMjBoAhroytA</recordid><startdate>20230630</startdate><enddate>20230630</enddate><creator>SHI YIHAN</creator><creator>SHI XIAOZE</creator><creator>SHAO QI</creator><creator>LIU SHIQI</creator><creator>LIAO SHAOJIE</creator><scope>EVB</scope></search><sort><creationdate>20230630</creationdate><title>Pole piece impedance testing device and consistency judgment method</title><author>SHI YIHAN ; SHI XIAOZE ; SHAO QI ; LIU SHIQI ; LIAO SHAOJIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116359768A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHI YIHAN</creatorcontrib><creatorcontrib>SHI XIAOZE</creatorcontrib><creatorcontrib>SHAO QI</creatorcontrib><creatorcontrib>LIU SHIQI</creatorcontrib><creatorcontrib>LIAO SHAOJIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHI YIHAN</au><au>SHI XIAOZE</au><au>SHAO QI</au><au>LIU SHIQI</au><au>LIAO SHAOJIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Pole piece impedance testing device and consistency judgment method</title><date>2023-06-30</date><risdate>2023</risdate><abstract>The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized.
一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Pole piece impedance testing device and consistency judgment method |
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