Pole piece impedance testing device and consistency judgment method

The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n di...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SHI YIHAN, SHI XIAOZE, SHAO QI, LIU SHIQI, LIAO SHAOJIE
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SHI YIHAN
SHI XIAOZE
SHAO QI
LIU SHIQI
LIAO SHAOJIE
description The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized. 一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116359768A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116359768A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116359768A3</originalsourceid><addsrcrecordid>eNrjZHAOyM9JVSjITE1OVcjMLUhNScwDskpSi0sy89IVUlLLMoHcxLwUheT8vOLM4pLUvORKhazSlPTc1LwShdzUkoz8FB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEu_sZ2hoZmxqaW5m4WhMjBoAhroytA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Pole piece impedance testing device and consistency judgment method</title><source>esp@cenet</source><creator>SHI YIHAN ; SHI XIAOZE ; SHAO QI ; LIU SHIQI ; LIAO SHAOJIE</creator><creatorcontrib>SHI YIHAN ; SHI XIAOZE ; SHAO QI ; LIU SHIQI ; LIAO SHAOJIE</creatorcontrib><description>The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized. 一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230630&amp;DB=EPODOC&amp;CC=CN&amp;NR=116359768A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230630&amp;DB=EPODOC&amp;CC=CN&amp;NR=116359768A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHI YIHAN</creatorcontrib><creatorcontrib>SHI XIAOZE</creatorcontrib><creatorcontrib>SHAO QI</creatorcontrib><creatorcontrib>LIU SHIQI</creatorcontrib><creatorcontrib>LIAO SHAOJIE</creatorcontrib><title>Pole piece impedance testing device and consistency judgment method</title><description>The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized. 一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOyM9JVSjITE1OVcjMLUhNScwDskpSi0sy89IVUlLLMoHcxLwUheT8vOLM4pLUvORKhazSlPTc1LwShdzUkoz8FB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEu_sZ2hoZmxqaW5m4WhMjBoAhroytA</recordid><startdate>20230630</startdate><enddate>20230630</enddate><creator>SHI YIHAN</creator><creator>SHI XIAOZE</creator><creator>SHAO QI</creator><creator>LIU SHIQI</creator><creator>LIAO SHAOJIE</creator><scope>EVB</scope></search><sort><creationdate>20230630</creationdate><title>Pole piece impedance testing device and consistency judgment method</title><author>SHI YIHAN ; SHI XIAOZE ; SHAO QI ; LIU SHIQI ; LIAO SHAOJIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116359768A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHI YIHAN</creatorcontrib><creatorcontrib>SHI XIAOZE</creatorcontrib><creatorcontrib>SHAO QI</creatorcontrib><creatorcontrib>LIU SHIQI</creatorcontrib><creatorcontrib>LIAO SHAOJIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHI YIHAN</au><au>SHI XIAOZE</au><au>SHAO QI</au><au>LIU SHIQI</au><au>LIAO SHAOJIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Pole piece impedance testing device and consistency judgment method</title><date>2023-06-30</date><risdate>2023</risdate><abstract>The invention discloses a pole piece impedance testing device and a consistency judgment method. The method comprises the following steps: acquiring an impedance value of a single point of a pole piece in a thickness direction; the position of the pole piece is adjusted, and impedance values of n different point positions of the pole piece in the thickness direction are collected; and calculating a variable coefficient according to the impedance values of the n different points, judging whether the variable coefficient is smaller than or equal to a set value, if so, determining that the consistency of the pole piece is good, and if not, determining that the consistency of the pole piece is poor. According to the method, characterization and judgment of the distribution consistency of the pole pieces can be quickly realized. 一种极片阻抗测试装置及一致性判断方法,其方法包括以下步骤:采集所述极片单个点位在厚度方向上的阻抗数值;调节该极片的位置,采集该极片n个不同点位在厚度方向上的阻抗数值;根据n个不同点位的阻抗数值计算出变异系数,判断所述变异系数是否小于等于设定值,若是,则该极片的一致性好,若不是,则该极片的一致性差。该方法能够快速实现对极片分布一致性的表征和判断。</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN116359768A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Pole piece impedance testing device and consistency judgment method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T17%3A29%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SHI%20YIHAN&rft.date=2023-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116359768A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true