Spectral analysis device, terminal equipment and imaging method
The invention provides a spectral analysis device, terminal equipment with the spectral analysis device and a working method, the spectral analysis device comprises a spectral chip, an optical system and at least one data processing unit, the optical system is located on an optical path of the spect...
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creator | FAN CE HUANG ZHILEI LI QINGQING WANG YU HUANG QIANYOU |
description | The invention provides a spectral analysis device, terminal equipment with the spectral analysis device and a working method, the spectral analysis device comprises a spectral chip, an optical system and at least one data processing unit, the optical system is located on an optical path of the spectral chip, and the data processing unit is located on the optical path of the spectral chip. Wherein the spectrum chip is electrically connected with the at least one data processing unit, the spectrum chip is provided with a plurality of transmission spectrum matrixes, and the optical system has a variable focal length, so that incident light entering the spectrum chip is modulated by the optical system by adjusting the focal length of the optical system, and the transmission spectrum matrixes are transmitted to the spectrum chip. And the data processing unit calculates spectral information corresponding to the incident light based on a specific transmission spectrum matrix corresponding to the spectral chip.
本发明提供 |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116359125A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116359125A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116359125A3</originalsourceid><addsrcrecordid>eNrjZLAPLkhNLilKzFFIzEvMqSzOLFZISS3LTE7VUShJLcrNBAoqpBaWZhbkpuaVANWkKGTmJqZn5qUr5KaWZOSn8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0MzY1NLQyNTR2Ni1AAAon0xCg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Spectral analysis device, terminal equipment and imaging method</title><source>esp@cenet</source><creator>FAN CE ; HUANG ZHILEI ; LI QINGQING ; WANG YU ; HUANG QIANYOU</creator><creatorcontrib>FAN CE ; HUANG ZHILEI ; LI QINGQING ; WANG YU ; HUANG QIANYOU</creatorcontrib><description>The invention provides a spectral analysis device, terminal equipment with the spectral analysis device and a working method, the spectral analysis device comprises a spectral chip, an optical system and at least one data processing unit, the optical system is located on an optical path of the spectral chip, and the data processing unit is located on the optical path of the spectral chip. Wherein the spectrum chip is electrically connected with the at least one data processing unit, the spectrum chip is provided with a plurality of transmission spectrum matrixes, and the optical system has a variable focal length, so that incident light entering the spectrum chip is modulated by the optical system by adjusting the focal length of the optical system, and the transmission spectrum matrixes are transmitted to the spectrum chip. And the data processing unit calculates spectral information corresponding to the incident light based on a specific transmission spectrum matrix corresponding to the spectral chip.
本发明提供</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230630&DB=EPODOC&CC=CN&NR=116359125A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230630&DB=EPODOC&CC=CN&NR=116359125A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FAN CE</creatorcontrib><creatorcontrib>HUANG ZHILEI</creatorcontrib><creatorcontrib>LI QINGQING</creatorcontrib><creatorcontrib>WANG YU</creatorcontrib><creatorcontrib>HUANG QIANYOU</creatorcontrib><title>Spectral analysis device, terminal equipment and imaging method</title><description>The invention provides a spectral analysis device, terminal equipment with the spectral analysis device and a working method, the spectral analysis device comprises a spectral chip, an optical system and at least one data processing unit, the optical system is located on an optical path of the spectral chip, and the data processing unit is located on the optical path of the spectral chip. Wherein the spectrum chip is electrically connected with the at least one data processing unit, the spectrum chip is provided with a plurality of transmission spectrum matrixes, and the optical system has a variable focal length, so that incident light entering the spectrum chip is modulated by the optical system by adjusting the focal length of the optical system, and the transmission spectrum matrixes are transmitted to the spectrum chip. And the data processing unit calculates spectral information corresponding to the incident light based on a specific transmission spectrum matrix corresponding to the spectral chip.
本发明提供</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAPLkhNLilKzFFIzEvMqSzOLFZISS3LTE7VUShJLcrNBAoqpBaWZhbkpuaVANWkKGTmJqZn5qUr5KaWZOSn8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0MzY1NLQyNTR2Ni1AAAon0xCg</recordid><startdate>20230630</startdate><enddate>20230630</enddate><creator>FAN CE</creator><creator>HUANG ZHILEI</creator><creator>LI QINGQING</creator><creator>WANG YU</creator><creator>HUANG QIANYOU</creator><scope>EVB</scope></search><sort><creationdate>20230630</creationdate><title>Spectral analysis device, terminal equipment and imaging method</title><author>FAN CE ; HUANG ZHILEI ; LI QINGQING ; WANG YU ; HUANG QIANYOU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116359125A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FAN CE</creatorcontrib><creatorcontrib>HUANG ZHILEI</creatorcontrib><creatorcontrib>LI QINGQING</creatorcontrib><creatorcontrib>WANG YU</creatorcontrib><creatorcontrib>HUANG QIANYOU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FAN CE</au><au>HUANG ZHILEI</au><au>LI QINGQING</au><au>WANG YU</au><au>HUANG QIANYOU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Spectral analysis device, terminal equipment and imaging method</title><date>2023-06-30</date><risdate>2023</risdate><abstract>The invention provides a spectral analysis device, terminal equipment with the spectral analysis device and a working method, the spectral analysis device comprises a spectral chip, an optical system and at least one data processing unit, the optical system is located on an optical path of the spectral chip, and the data processing unit is located on the optical path of the spectral chip. Wherein the spectrum chip is electrically connected with the at least one data processing unit, the spectrum chip is provided with a plurality of transmission spectrum matrixes, and the optical system has a variable focal length, so that incident light entering the spectrum chip is modulated by the optical system by adjusting the focal length of the optical system, and the transmission spectrum matrixes are transmitted to the spectrum chip. And the data processing unit calculates spectral information corresponding to the incident light based on a specific transmission spectrum matrix corresponding to the spectral chip.
本发明提供</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Spectral analysis device, terminal equipment and imaging method |
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