Calibration circuit of analog-to-digital converter

The invention relates to the technical field of integrated circuits, and discloses a calibration circuit of an analog-to-digital converter, which comprises a known sequence error matrix calculation circuit for obtaining framing information from an optical digital signal processor and a data stream a...

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Hauptverfasser: CHENG CHANG, HUANG YONGHENG, CAI MINQING, WANG HAONAN, LEE SEUNGUL, WANG HUI
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creator CHENG CHANG
HUANG YONGHENG
CAI MINQING
WANG HAONAN
LEE SEUNGUL
WANG HUI
description The invention relates to the technical field of integrated circuits, and discloses a calibration circuit of an analog-to-digital converter, which comprises a known sequence error matrix calculation circuit for obtaining framing information from an optical digital signal processor and a data stream after damage elimination so as to calculate an error matrix; the first known sequence recovery circuit is used for sampling data between the optical channel and the analog-to-digital converter and obtaining a first known sequence data stream according to the framing information and the error matrix; the second known sequence recovery circuit is used for sampling data between the analog-to-digital converter and the optical digital signal processor and obtaining a second known sequence data stream according to the framing information and the error matrix; the calibration control word generating circuit is used for generating proportional, offset and delay calibration control words according to the first known sequence
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116346130A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116346130A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116346130A3</originalsourceid><addsrcrecordid>eNrjZDByTszJTCpKLMnMz1NIzixKLs0sUchPU0jMS8zJT9ctyddNyUzPLEnMUUjOzytLLSpJLeJhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGZsYmZobGBo7GxKgBANOSLCA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Calibration circuit of analog-to-digital converter</title><source>esp@cenet</source><creator>CHENG CHANG ; HUANG YONGHENG ; CAI MINQING ; WANG HAONAN ; LEE SEUNGUL ; WANG HUI</creator><creatorcontrib>CHENG CHANG ; HUANG YONGHENG ; CAI MINQING ; WANG HAONAN ; LEE SEUNGUL ; WANG HUI</creatorcontrib><description>The invention relates to the technical field of integrated circuits, and discloses a calibration circuit of an analog-to-digital converter, which comprises a known sequence error matrix calculation circuit for obtaining framing information from an optical digital signal processor and a data stream after damage elimination so as to calculate an error matrix; the first known sequence recovery circuit is used for sampling data between the optical channel and the analog-to-digital converter and obtaining a first known sequence data stream according to the framing information and the error matrix; the second known sequence recovery circuit is used for sampling data between the analog-to-digital converter and the optical digital signal processor and obtaining a second known sequence data stream according to the framing information and the error matrix; the calibration control word generating circuit is used for generating proportional, offset and delay calibration control words according to the first known sequence</description><language>chi ; eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230627&amp;DB=EPODOC&amp;CC=CN&amp;NR=116346130A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230627&amp;DB=EPODOC&amp;CC=CN&amp;NR=116346130A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHENG CHANG</creatorcontrib><creatorcontrib>HUANG YONGHENG</creatorcontrib><creatorcontrib>CAI MINQING</creatorcontrib><creatorcontrib>WANG HAONAN</creatorcontrib><creatorcontrib>LEE SEUNGUL</creatorcontrib><creatorcontrib>WANG HUI</creatorcontrib><title>Calibration circuit of analog-to-digital converter</title><description>The invention relates to the technical field of integrated circuits, and discloses a calibration circuit of an analog-to-digital converter, which comprises a known sequence error matrix calculation circuit for obtaining framing information from an optical digital signal processor and a data stream after damage elimination so as to calculate an error matrix; the first known sequence recovery circuit is used for sampling data between the optical channel and the analog-to-digital converter and obtaining a first known sequence data stream according to the framing information and the error matrix; the second known sequence recovery circuit is used for sampling data between the analog-to-digital converter and the optical digital signal processor and obtaining a second known sequence data stream according to the framing information and the error matrix; the calibration control word generating circuit is used for generating proportional, offset and delay calibration control words according to the first known sequence</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDByTszJTCpKLMnMz1NIzixKLs0sUchPU0jMS8zJT9ctyddNyUzPLEnMUUjOzytLLSpJLeJhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGZsYmZobGBo7GxKgBANOSLCA</recordid><startdate>20230627</startdate><enddate>20230627</enddate><creator>CHENG CHANG</creator><creator>HUANG YONGHENG</creator><creator>CAI MINQING</creator><creator>WANG HAONAN</creator><creator>LEE SEUNGUL</creator><creator>WANG HUI</creator><scope>EVB</scope></search><sort><creationdate>20230627</creationdate><title>Calibration circuit of analog-to-digital converter</title><author>CHENG CHANG ; HUANG YONGHENG ; CAI MINQING ; WANG HAONAN ; LEE SEUNGUL ; WANG HUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116346130A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>CHENG CHANG</creatorcontrib><creatorcontrib>HUANG YONGHENG</creatorcontrib><creatorcontrib>CAI MINQING</creatorcontrib><creatorcontrib>WANG HAONAN</creatorcontrib><creatorcontrib>LEE SEUNGUL</creatorcontrib><creatorcontrib>WANG HUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHENG CHANG</au><au>HUANG YONGHENG</au><au>CAI MINQING</au><au>WANG HAONAN</au><au>LEE SEUNGUL</au><au>WANG HUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Calibration circuit of analog-to-digital converter</title><date>2023-06-27</date><risdate>2023</risdate><abstract>The invention relates to the technical field of integrated circuits, and discloses a calibration circuit of an analog-to-digital converter, which comprises a known sequence error matrix calculation circuit for obtaining framing information from an optical digital signal processor and a data stream after damage elimination so as to calculate an error matrix; the first known sequence recovery circuit is used for sampling data between the optical channel and the analog-to-digital converter and obtaining a first known sequence data stream according to the framing information and the error matrix; the second known sequence recovery circuit is used for sampling data between the analog-to-digital converter and the optical digital signal processor and obtaining a second known sequence data stream according to the framing information and the error matrix; the calibration control word generating circuit is used for generating proportional, offset and delay calibration control words according to the first known sequence</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
title Calibration circuit of analog-to-digital converter
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T18%3A09%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHENG%20CHANG&rft.date=2023-06-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116346130A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true