Near infrared spectrum-based walnut kernel quality detection device and method
The invention discloses a walnut kernel quality detection device and method based on a near infrared spectrum. A detection device hardware part composed of a near infrared diffuse reflection optical fiber spectrometer, a halogen light source, a Y-shaped optical fiber and a portable microcomputer is...
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creator | MAIHEMUJIANG. BATU ABULIZI. BASITI SUN LINA ZHU ZHAOSHUAI ZHU ZHANJIANG MAO WULAN SHEN XIAOHE LIU JIA MA WENQIANG YANG LILING CUI KUANBO LUO WENJIE YANG ZHONGQIANG LIU KUI |
description | The invention discloses a walnut kernel quality detection device and method based on a near infrared spectrum. A detection device hardware part composed of a near infrared diffuse reflection optical fiber spectrometer, a halogen light source, a Y-shaped optical fiber and a portable microcomputer is adopted; detection parameter setting, spectrum acquisition and quality detection functions are realized through a software system integrated in a portable microcomputer; the walnut kernel quality detection method based on near infrared spectrum information is a method for rapidly and nondestructively detecting the quality of walnut kernels, and solves the technical problems that the internal quality is difficult to distinguish in the current walnut kernel production, the sample is damaged by chemical detection, and the detection time is relatively long.
一种基于近红外光谱的核桃仁品质检测装置及方法,采用近红外漫反射光纤光谱仪、卤素光源、Y型光纤和便携式微型计算机组成的检测装置硬件部分,通过在便携式微型计算机集成的软件系统实现检测的参数设置、光谱获取及品质检测功能;本发明基于近红外光谱信息的核桃仁品质检测,是一种快速无损检测核桃仁品质的方法,解决了当前核桃仁生产中难以对内部品质 |
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一种基于近红外光谱的核桃仁品质检测装置及方法,采用近红外漫反射光纤光谱仪、卤素光源、Y型光纤和便携式微型计算机组成的检测装置硬件部分,通过在便携式微型计算机集成的软件系统实现检测的参数设置、光谱获取及品质检测功能;本发明基于近红外光谱信息的核桃仁品质检测,是一种快速无损检测核桃仁品质的方法,解决了当前核桃仁生产中难以对内部品质</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNij0KAjEUBrexEPUOzwNskV1QLGVRrFLZL8_kWwxmk5gfxdubwgNYzQzMspESHMm4KXKEphSgcixze-NU883WlUwPRAdLz8LW5A9p5HoZ76q9jAKx0zQj371eN4uJbcLmx1WzPZ-uw6VF8CNSYAWHPA5SiF132PeiO_b_PF86qzbN</recordid><startdate>20230623</startdate><enddate>20230623</enddate><creator>MAIHEMUJIANG. BATU</creator><creator>ABULIZI. BASITI</creator><creator>SUN LINA</creator><creator>ZHU ZHAOSHUAI</creator><creator>ZHU ZHANJIANG</creator><creator>MAO WULAN</creator><creator>SHEN XIAOHE</creator><creator>LIU JIA</creator><creator>MA WENQIANG</creator><creator>YANG LILING</creator><creator>CUI KUANBO</creator><creator>LUO WENJIE</creator><creator>YANG ZHONGQIANG</creator><creator>LIU KUI</creator><scope>EVB</scope></search><sort><creationdate>20230623</creationdate><title>Near infrared spectrum-based walnut kernel quality detection device and method</title><author>MAIHEMUJIANG. BATU ; ABULIZI. BASITI ; SUN LINA ; ZHU ZHAOSHUAI ; ZHU ZHANJIANG ; MAO WULAN ; SHEN XIAOHE ; LIU JIA ; MA WENQIANG ; YANG LILING ; CUI KUANBO ; LUO WENJIE ; YANG ZHONGQIANG ; LIU KUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116297312A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MAIHEMUJIANG. BATU</creatorcontrib><creatorcontrib>ABULIZI. BASITI</creatorcontrib><creatorcontrib>SUN LINA</creatorcontrib><creatorcontrib>ZHU ZHAOSHUAI</creatorcontrib><creatorcontrib>ZHU ZHANJIANG</creatorcontrib><creatorcontrib>MAO WULAN</creatorcontrib><creatorcontrib>SHEN XIAOHE</creatorcontrib><creatorcontrib>LIU JIA</creatorcontrib><creatorcontrib>MA WENQIANG</creatorcontrib><creatorcontrib>YANG LILING</creatorcontrib><creatorcontrib>CUI KUANBO</creatorcontrib><creatorcontrib>LUO WENJIE</creatorcontrib><creatorcontrib>YANG ZHONGQIANG</creatorcontrib><creatorcontrib>LIU KUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MAIHEMUJIANG. BATU</au><au>ABULIZI. BASITI</au><au>SUN LINA</au><au>ZHU ZHAOSHUAI</au><au>ZHU ZHANJIANG</au><au>MAO WULAN</au><au>SHEN XIAOHE</au><au>LIU JIA</au><au>MA WENQIANG</au><au>YANG LILING</au><au>CUI KUANBO</au><au>LUO WENJIE</au><au>YANG ZHONGQIANG</au><au>LIU KUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Near infrared spectrum-based walnut kernel quality detection device and method</title><date>2023-06-23</date><risdate>2023</risdate><abstract>The invention discloses a walnut kernel quality detection device and method based on a near infrared spectrum. A detection device hardware part composed of a near infrared diffuse reflection optical fiber spectrometer, a halogen light source, a Y-shaped optical fiber and a portable microcomputer is adopted; detection parameter setting, spectrum acquisition and quality detection functions are realized through a software system integrated in a portable microcomputer; the walnut kernel quality detection method based on near infrared spectrum information is a method for rapidly and nondestructively detecting the quality of walnut kernels, and solves the technical problems that the internal quality is difficult to distinguish in the current walnut kernel production, the sample is damaged by chemical detection, and the detection time is relatively long.
一种基于近红外光谱的核桃仁品质检测装置及方法,采用近红外漫反射光纤光谱仪、卤素光源、Y型光纤和便携式微型计算机组成的检测装置硬件部分,通过在便携式微型计算机集成的软件系统实现检测的参数设置、光谱获取及品质检测功能;本发明基于近红外光谱信息的核桃仁品质检测,是一种快速无损检测核桃仁品质的方法,解决了当前核桃仁生产中难以对内部品质</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Near infrared spectrum-based walnut kernel quality detection device and method |
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