Silicon rod detection method and detection equipment
The embodiment of the invention provides a silicon rod detection method and detection equipment, and the method comprises the steps: collecting a plurality of data points on the peripheral contour of a silicon rod, and enabling the data points to be arranged at intervals in the circumferential direc...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides a silicon rod detection method and detection equipment, and the method comprises the steps: collecting a plurality of data points on the peripheral contour of a silicon rod, and enabling the data points to be arranged at intervals in the circumferential direction of the silicon rod; a plurality of data points are sequentially connected to form a fitting curve, the fitting curve is divided into a plurality of curve sections, the slope of each curve section is calculated, and if two adjacent curve sections meet the condition that ki + 1-ki is larger than epsilon, and epsilon is a sudden change judgment threshold value, the ith curve section and the (i + 1) th curve section have crystal lines in corresponding areas on the peripheral contour of the silicon rod. According to the silicon rod detection method provided by the embodiment of the invention, the plurality of data points are acquired on the peripheral contour of the silicon rod to form the fitting curve, whether th |
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