High-precision rapid infrared transmitter test system

High-precision rapid infrared transmitter test system

The invention relates to a high-precision rapid infrared transmitter test system, and the system comprises an upper computer control system which is used for transmitting a control instruction to a lower computer and carrying out the processing and analysis of test data collected by the lower comput...

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Hauptverfasser: LI HAIGUANG, CHENG MUHAI, YAN ZHIZHEN
Format: Patent
Sprache:chi ; eng
Schlagworte:
PHYSICS
SIGNALLING
TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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creator LI HAIGUANG
CHENG MUHAI
YAN ZHIZHEN
description The invention relates to a high-precision rapid infrared transmitter test system, and the system comprises an upper computer control system which is used for transmitting a control instruction to a lower computer and carrying out the processing and analysis of test data collected by the lower computer; the lower computer is used for receiving the control instruction and controlling the test acquisition device to test the to-be-tested infrared transmitter based on the control instruction; the clamping jaw is connected to the feeding air cylinder through a sliding rail and used for clamping and sending an infrared transmitter to be tested to a testing position. The guide sheet is arranged on the test position and is used for dividing a pin of the to-be-tested infrared transmitter to two sides; the power-up electrode comprises two sawtooth-shaped electrode elastic pieces, and electrodes are installed in sawtooth recesses of the electrode elastic pieces and used for powering up pins of the infrared transmitter to
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subjects PHYSICS
SIGNALLING
TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
title High-precision rapid infrared transmitter test system
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