Capacitive voltage transformer dielectric loss measurement error correction method and device

The invention relates to a capacitor voltage transformer dielectric loss measurement error correction method and device. The method comprises the following steps: constructing a dielectric loss measurement equivalent analysis circuit based on a dielectric loss equivalent circuit as a target circuit...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHEN GUANG, ZENG XINGHONG, SONG YUNXIANG, GUO YINNAN, QIN YAN, CHEN SIHUA, WEN JIEZHENG, TAN ZHUOJUN, LUO ZANCHEN, ZHENG HE, ZHONG HONGLE, LU YINGJUN, WANG XIAMING, YANG ZHENG, LI GANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHEN GUANG
ZENG XINGHONG
SONG YUNXIANG
GUO YINNAN
QIN YAN
CHEN SIHUA
WEN JIEZHENG
TAN ZHUOJUN
LUO ZANCHEN
ZHENG HE
ZHONG HONGLE
LU YINGJUN
WANG XIAMING
YANG ZHENG
LI GANG
description The invention relates to a capacitor voltage transformer dielectric loss measurement error correction method and device. The method comprises the following steps: constructing a dielectric loss measurement equivalent analysis circuit based on a dielectric loss equivalent circuit as a target circuit model; the target circuit model is used for quantitatively calculating dielectric loss test data of the capacitor voltage transformer under the influence of the interference branch; obtaining a target expression set corresponding to the target circuit model, and obtaining a first dielectric loss value and a first capacitance parameter corresponding to an electromagnetic unit in the capacitive voltage transformer according to the target expression set; and determining a dielectric loss measurement correction result as corrected dielectric loss data corresponding to a capacitive voltage divider in the capacitive voltage transformer according to test current parameter information obtained by measurement under a preset
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116125358A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116125358A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116125358A3</originalsourceid><addsrcrecordid>eNqNjTEKwkAQRdNYiHqH8QAWMURsw6JYWdlKGHZ_dGGzE2bHnN8UHsDqFe_BW1dPxxP7aHEGzZKMXyBTzmUQHaEUIhK8afSUpBQaweWjGJGNoCpKXlSXIkpepL0lEOdAAXP02FargVPB7sdNtb9eHu52wCQ9ynJGhvXuXten-tg27blr_mm-hBI9Jw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Capacitive voltage transformer dielectric loss measurement error correction method and device</title><source>esp@cenet</source><creator>CHEN GUANG ; ZENG XINGHONG ; SONG YUNXIANG ; GUO YINNAN ; QIN YAN ; CHEN SIHUA ; WEN JIEZHENG ; TAN ZHUOJUN ; LUO ZANCHEN ; ZHENG HE ; ZHONG HONGLE ; LU YINGJUN ; WANG XIAMING ; YANG ZHENG ; LI GANG</creator><creatorcontrib>CHEN GUANG ; ZENG XINGHONG ; SONG YUNXIANG ; GUO YINNAN ; QIN YAN ; CHEN SIHUA ; WEN JIEZHENG ; TAN ZHUOJUN ; LUO ZANCHEN ; ZHENG HE ; ZHONG HONGLE ; LU YINGJUN ; WANG XIAMING ; YANG ZHENG ; LI GANG</creatorcontrib><description>The invention relates to a capacitor voltage transformer dielectric loss measurement error correction method and device. The method comprises the following steps: constructing a dielectric loss measurement equivalent analysis circuit based on a dielectric loss equivalent circuit as a target circuit model; the target circuit model is used for quantitatively calculating dielectric loss test data of the capacitor voltage transformer under the influence of the interference branch; obtaining a target expression set corresponding to the target circuit model, and obtaining a first dielectric loss value and a first capacitance parameter corresponding to an electromagnetic unit in the capacitive voltage transformer according to the target expression set; and determining a dielectric loss measurement correction result as corrected dielectric loss data corresponding to a capacitive voltage divider in the capacitive voltage transformer according to test current parameter information obtained by measurement under a preset</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230516&amp;DB=EPODOC&amp;CC=CN&amp;NR=116125358A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230516&amp;DB=EPODOC&amp;CC=CN&amp;NR=116125358A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN GUANG</creatorcontrib><creatorcontrib>ZENG XINGHONG</creatorcontrib><creatorcontrib>SONG YUNXIANG</creatorcontrib><creatorcontrib>GUO YINNAN</creatorcontrib><creatorcontrib>QIN YAN</creatorcontrib><creatorcontrib>CHEN SIHUA</creatorcontrib><creatorcontrib>WEN JIEZHENG</creatorcontrib><creatorcontrib>TAN ZHUOJUN</creatorcontrib><creatorcontrib>LUO ZANCHEN</creatorcontrib><creatorcontrib>ZHENG HE</creatorcontrib><creatorcontrib>ZHONG HONGLE</creatorcontrib><creatorcontrib>LU YINGJUN</creatorcontrib><creatorcontrib>WANG XIAMING</creatorcontrib><creatorcontrib>YANG ZHENG</creatorcontrib><creatorcontrib>LI GANG</creatorcontrib><title>Capacitive voltage transformer dielectric loss measurement error correction method and device</title><description>The invention relates to a capacitor voltage transformer dielectric loss measurement error correction method and device. The method comprises the following steps: constructing a dielectric loss measurement equivalent analysis circuit based on a dielectric loss equivalent circuit as a target circuit model; the target circuit model is used for quantitatively calculating dielectric loss test data of the capacitor voltage transformer under the influence of the interference branch; obtaining a target expression set corresponding to the target circuit model, and obtaining a first dielectric loss value and a first capacitance parameter corresponding to an electromagnetic unit in the capacitive voltage transformer according to the target expression set; and determining a dielectric loss measurement correction result as corrected dielectric loss data corresponding to a capacitive voltage divider in the capacitive voltage transformer according to test current parameter information obtained by measurement under a preset</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTEKwkAQRdNYiHqH8QAWMURsw6JYWdlKGHZ_dGGzE2bHnN8UHsDqFe_BW1dPxxP7aHEGzZKMXyBTzmUQHaEUIhK8afSUpBQaweWjGJGNoCpKXlSXIkpepL0lEOdAAXP02FargVPB7sdNtb9eHu52wCQ9ynJGhvXuXten-tg27blr_mm-hBI9Jw</recordid><startdate>20230516</startdate><enddate>20230516</enddate><creator>CHEN GUANG</creator><creator>ZENG XINGHONG</creator><creator>SONG YUNXIANG</creator><creator>GUO YINNAN</creator><creator>QIN YAN</creator><creator>CHEN SIHUA</creator><creator>WEN JIEZHENG</creator><creator>TAN ZHUOJUN</creator><creator>LUO ZANCHEN</creator><creator>ZHENG HE</creator><creator>ZHONG HONGLE</creator><creator>LU YINGJUN</creator><creator>WANG XIAMING</creator><creator>YANG ZHENG</creator><creator>LI GANG</creator><scope>EVB</scope></search><sort><creationdate>20230516</creationdate><title>Capacitive voltage transformer dielectric loss measurement error correction method and device</title><author>CHEN GUANG ; ZENG XINGHONG ; SONG YUNXIANG ; GUO YINNAN ; QIN YAN ; CHEN SIHUA ; WEN JIEZHENG ; TAN ZHUOJUN ; LUO ZANCHEN ; ZHENG HE ; ZHONG HONGLE ; LU YINGJUN ; WANG XIAMING ; YANG ZHENG ; LI GANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116125358A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN GUANG</creatorcontrib><creatorcontrib>ZENG XINGHONG</creatorcontrib><creatorcontrib>SONG YUNXIANG</creatorcontrib><creatorcontrib>GUO YINNAN</creatorcontrib><creatorcontrib>QIN YAN</creatorcontrib><creatorcontrib>CHEN SIHUA</creatorcontrib><creatorcontrib>WEN JIEZHENG</creatorcontrib><creatorcontrib>TAN ZHUOJUN</creatorcontrib><creatorcontrib>LUO ZANCHEN</creatorcontrib><creatorcontrib>ZHENG HE</creatorcontrib><creatorcontrib>ZHONG HONGLE</creatorcontrib><creatorcontrib>LU YINGJUN</creatorcontrib><creatorcontrib>WANG XIAMING</creatorcontrib><creatorcontrib>YANG ZHENG</creatorcontrib><creatorcontrib>LI GANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN GUANG</au><au>ZENG XINGHONG</au><au>SONG YUNXIANG</au><au>GUO YINNAN</au><au>QIN YAN</au><au>CHEN SIHUA</au><au>WEN JIEZHENG</au><au>TAN ZHUOJUN</au><au>LUO ZANCHEN</au><au>ZHENG HE</au><au>ZHONG HONGLE</au><au>LU YINGJUN</au><au>WANG XIAMING</au><au>YANG ZHENG</au><au>LI GANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Capacitive voltage transformer dielectric loss measurement error correction method and device</title><date>2023-05-16</date><risdate>2023</risdate><abstract>The invention relates to a capacitor voltage transformer dielectric loss measurement error correction method and device. The method comprises the following steps: constructing a dielectric loss measurement equivalent analysis circuit based on a dielectric loss equivalent circuit as a target circuit model; the target circuit model is used for quantitatively calculating dielectric loss test data of the capacitor voltage transformer under the influence of the interference branch; obtaining a target expression set corresponding to the target circuit model, and obtaining a first dielectric loss value and a first capacitance parameter corresponding to an electromagnetic unit in the capacitive voltage transformer according to the target expression set; and determining a dielectric loss measurement correction result as corrected dielectric loss data corresponding to a capacitive voltage divider in the capacitive voltage transformer according to test current parameter information obtained by measurement under a preset</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN116125358A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Capacitive voltage transformer dielectric loss measurement error correction method and device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T02%3A28%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20GUANG&rft.date=2023-05-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116125358A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true