Perovskite solar cell film layer uniformity test method

The invention provides a perovskite solar cell film layer uniformity test method, which comprises the following steps of performing first laser scribing on a to-be-tested perovskite solar cell, and dividing the to-be-tested perovskite solar cell into a plurality of test sub-cells; second laser scrib...

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Bibliographische Detailangaben
Hauptverfasser: HE WEI, LAN SHENKAI, CHAI JIN, GUO QIHAO, PENG JIANLIN, LONG QINGDE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a perovskite solar cell film layer uniformity test method, which comprises the following steps of performing first laser scribing on a to-be-tested perovskite solar cell, and dividing the to-be-tested perovskite solar cell into a plurality of test sub-cells; second laser scribing is carried out on each test sub-battery, the test sub-battery is divided into a first test area and a second test area which are spaced from each other, and the first electrode layers of the first test area and the second test area are completely connected; each test sub-battery is connected with a detection circuit; a first detection electrode of a detection circuit is connected with the uppermost electrode layer in the first test area, a second detection electrode of the detection circuit is connected with the uppermost electrode layer in the second test area, and a detection loop is formed for testing the photoelectric conversion performance. According to the perovskite solar cell film layer uniformity test