Non-contact type double-zero foil material surface groove inspection system

Non-contact type double-zero foil material surface groove inspection system

The invention discloses a contact-free double-zero foil material surface groove inspection system which is characterized in that mounting grooves are formed in the lower surface of an upper box body and the upper surface of a lower box body, the mounting grooves are wavy, the bending radian of the m...

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Hauptverfasser: SHI YUANPAN, XIAO JIANWEI, HUANG SHOUZHI, ZHANG TIANSHUAI, LYU JUNXIN
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator SHI YUANPAN
XIAO JIANWEI
HUANG SHOUZHI
ZHANG TIANSHUAI
LYU JUNXIN
description The invention discloses a contact-free double-zero foil material surface groove inspection system which is characterized in that mounting grooves are formed in the lower surface of an upper box body and the upper surface of a lower box body, the mounting grooves are wavy, the bending radian of the mounting grooves is semi-elliptical arc, multiple rows of infrared emission assemblies are rotationally connected and mounted on the surfaces of the mounting grooves, and the infrared emission assemblies are arranged in the mounting grooves. The side wall of one side of the upper box body and the side wall of one side of the lower box body are connected through a cross clamp, storages, processors and emitters which are communicated with the infrared emission assemblies are installed in the upper box body and the lower box body, and control panels used for controlling the infrared emission assemblies are installed on the surfaces of the upper box body and the lower box body; according to the device, the crossed clamp
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Non-contact type double-zero foil material surface groove inspection system
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