Part detection method, device and equipment and storage medium
The invention relates to a part detection method and device, equipment and a storage medium. According to the embodiment of the invention, the identification number of the to-be-tested part is obtained; obtaining an actual outer contour of the to-be-detected part in each preset projection direction,...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | XIE HUI YI JIANYE YU SHANSHAN JIN ZUOHUI |
description | The invention relates to a part detection method and device, equipment and a storage medium. According to the embodiment of the invention, the identification number of the to-be-tested part is obtained; obtaining an actual outer contour of the to-be-detected part in each preset projection direction, and a standard outer contour of a target part corresponding to the identification number in each preset projection direction; for each preset projection direction, calculating the contour similarity of the actual outer contour of the preset projection direction relative to the standard outer contour of the preset projection direction; and when the contour similarity corresponding to each preset projection direction is greater than the preset threshold, determining that the to-be-detected part is a qualified part of the target part, so that the accuracy of part contour detection can be improved, automatic comparison detection can be performed on the contour of the corresponding part according to the part identifica |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116071365A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116071365A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116071365A3</originalsourceid><addsrcrecordid>eNrjZLALSCwqUUhJLUlNLsnMz1PITS3JyE_RAYqUZSanKiTmpSikFpZmFuSm5pWAecUl-UWJ6alAhSmZpbk8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MzA3NDYzNTRmBg1ADdKMEg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Part detection method, device and equipment and storage medium</title><source>esp@cenet</source><creator>XIE HUI ; YI JIANYE ; YU SHANSHAN ; JIN ZUOHUI</creator><creatorcontrib>XIE HUI ; YI JIANYE ; YU SHANSHAN ; JIN ZUOHUI</creatorcontrib><description>The invention relates to a part detection method and device, equipment and a storage medium. According to the embodiment of the invention, the identification number of the to-be-tested part is obtained; obtaining an actual outer contour of the to-be-detected part in each preset projection direction, and a standard outer contour of a target part corresponding to the identification number in each preset projection direction; for each preset projection direction, calculating the contour similarity of the actual outer contour of the preset projection direction relative to the standard outer contour of the preset projection direction; and when the contour similarity corresponding to each preset projection direction is greater than the preset threshold, determining that the to-be-detected part is a qualified part of the target part, so that the accuracy of part contour detection can be improved, automatic comparison detection can be performed on the contour of the corresponding part according to the part identifica</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230505&DB=EPODOC&CC=CN&NR=116071365A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76304</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230505&DB=EPODOC&CC=CN&NR=116071365A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIE HUI</creatorcontrib><creatorcontrib>YI JIANYE</creatorcontrib><creatorcontrib>YU SHANSHAN</creatorcontrib><creatorcontrib>JIN ZUOHUI</creatorcontrib><title>Part detection method, device and equipment and storage medium</title><description>The invention relates to a part detection method and device, equipment and a storage medium. According to the embodiment of the invention, the identification number of the to-be-tested part is obtained; obtaining an actual outer contour of the to-be-detected part in each preset projection direction, and a standard outer contour of a target part corresponding to the identification number in each preset projection direction; for each preset projection direction, calculating the contour similarity of the actual outer contour of the preset projection direction relative to the standard outer contour of the preset projection direction; and when the contour similarity corresponding to each preset projection direction is greater than the preset threshold, determining that the to-be-detected part is a qualified part of the target part, so that the accuracy of part contour detection can be improved, automatic comparison detection can be performed on the contour of the corresponding part according to the part identifica</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLALSCwqUUhJLUlNLsnMz1PITS3JyE_RAYqUZSanKiTmpSikFpZmFuSm5pWAecUl-UWJ6alAhSmZpbk8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MzA3NDYzNTRmBg1ADdKMEg</recordid><startdate>20230505</startdate><enddate>20230505</enddate><creator>XIE HUI</creator><creator>YI JIANYE</creator><creator>YU SHANSHAN</creator><creator>JIN ZUOHUI</creator><scope>EVB</scope></search><sort><creationdate>20230505</creationdate><title>Part detection method, device and equipment and storage medium</title><author>XIE HUI ; YI JIANYE ; YU SHANSHAN ; JIN ZUOHUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116071365A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIE HUI</creatorcontrib><creatorcontrib>YI JIANYE</creatorcontrib><creatorcontrib>YU SHANSHAN</creatorcontrib><creatorcontrib>JIN ZUOHUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIE HUI</au><au>YI JIANYE</au><au>YU SHANSHAN</au><au>JIN ZUOHUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Part detection method, device and equipment and storage medium</title><date>2023-05-05</date><risdate>2023</risdate><abstract>The invention relates to a part detection method and device, equipment and a storage medium. According to the embodiment of the invention, the identification number of the to-be-tested part is obtained; obtaining an actual outer contour of the to-be-detected part in each preset projection direction, and a standard outer contour of a target part corresponding to the identification number in each preset projection direction; for each preset projection direction, calculating the contour similarity of the actual outer contour of the preset projection direction relative to the standard outer contour of the preset projection direction; and when the contour similarity corresponding to each preset projection direction is greater than the preset threshold, determining that the to-be-detected part is a qualified part of the target part, so that the accuracy of part contour detection can be improved, automatic comparison detection can be performed on the contour of the corresponding part according to the part identifica</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN116071365A |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Part detection method, device and equipment and storage medium |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T10%3A14%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XIE%20HUI&rft.date=2023-05-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116071365A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |