Method for testing crystallization temperature of high-aluminum-silicon cover plate glass
The invention discloses a method for testing the crystallization temperature of high-aluminum-silicon cover plate glass. The testing method comprises the following steps: pretreating a to-be-tested glass sample; putting the pretreated to-be-tested glass sample into a gradient temperature furnace thr...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | TANG BINGJIE XUE XINJIAN FAN JING MA YUFEI LIU YINGZHOU NIU TAOXIA |
| description | The invention discloses a method for testing the crystallization temperature of high-aluminum-silicon cover plate glass. The testing method comprises the following steps: pretreating a to-be-tested glass sample; putting the pretreated to-be-tested glass sample into a gradient temperature furnace through a platinum boat, and preserving heat for 24 hours or more; after heat preservation is completed, taking out the glass sample to be tested and cooling; and observing the cooled glass sample to be tested. The influence of non-uniform sample melting and impurities brought in in the sample preparation process on the crystallization temperature test result can be avoided, and the accuracy of the crystallization temperature test result is improved.
本发明公开了一种高铝硅盖板玻璃析晶温度的测试方法，该测试方法包括以下步骤：将待测试玻璃样品进行预处理；将预处理完成的待测试玻璃样品通过铂金舟放入梯温炉中，保温24h及以上；保温完成之后，将待测试玻璃样品取出冷却；对冷却后的待测试玻璃样品进行观察。能够避免因熔样不均及制样过程中带入杂质对析晶温度测试结果的影响，提高了析晶温度测试结果的准确性。 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116068012A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116068012A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116068012A3</originalsourceid><addsrcrecordid>eNqNyj0KwkAQQOE0FqLeYTxAIFEIthIUG61srMKwTpKB2R92JoKe3hQewOrB41sWjyvZGJ_QxwxGahwGcPmthiL8QeMY5u8TZbQpE8QeRh7GEmXyHCZfKgu7Gbn4ogxJ0AgGQdV1sehRlDa_rort-XRvLyWl2JEmdBTIuvZW103VHKp6d9z_Y75jbDuJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for testing crystallization temperature of high-aluminum-silicon cover plate glass</title><source>esp@cenet</source><creator>TANG BINGJIE ; XUE XINJIAN ; FAN JING ; MA YUFEI ; LIU YINGZHOU ; NIU TAOXIA</creator><creatorcontrib>TANG BINGJIE ; XUE XINJIAN ; FAN JING ; MA YUFEI ; LIU YINGZHOU ; NIU TAOXIA</creatorcontrib><description>The invention discloses a method for testing the crystallization temperature of high-aluminum-silicon cover plate glass. The testing method comprises the following steps: pretreating a to-be-tested glass sample; putting the pretreated to-be-tested glass sample into a gradient temperature furnace through a platinum boat, and preserving heat for 24 hours or more; after heat preservation is completed, taking out the glass sample to be tested and cooling; and observing the cooled glass sample to be tested. The influence of non-uniform sample melting and impurities brought in in the sample preparation process on the crystallization temperature test result can be avoided, and the accuracy of the crystallization temperature test result is improved.
本发明公开了一种高铝硅盖板玻璃析晶温度的测试方法，该测试方法包括以下步骤：将待测试玻璃样品进行预处理；将预处理完成的待测试玻璃样品通过铂金舟放入梯温炉中，保温24h及以上；保温完成之后，将待测试玻璃样品取出冷却；对冷却后的待测试玻璃样品进行观察。能够避免因熔样不均及制样过程中带入杂质对析晶温度测试结果的影响，提高了析晶温度测试结果的准确性。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230505&DB=EPODOC&CC=CN&NR=116068012A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230505&DB=EPODOC&CC=CN&NR=116068012A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANG BINGJIE</creatorcontrib><creatorcontrib>XUE XINJIAN</creatorcontrib><creatorcontrib>FAN JING</creatorcontrib><creatorcontrib>MA YUFEI</creatorcontrib><creatorcontrib>LIU YINGZHOU</creatorcontrib><creatorcontrib>NIU TAOXIA</creatorcontrib><title>Method for testing crystallization temperature of high-aluminum-silicon cover plate glass</title><description>The invention discloses a method for testing the crystallization temperature of high-aluminum-silicon cover plate glass. The testing method comprises the following steps: pretreating a to-be-tested glass sample; putting the pretreated to-be-tested glass sample into a gradient temperature furnace through a platinum boat, and preserving heat for 24 hours or more; after heat preservation is completed, taking out the glass sample to be tested and cooling; and observing the cooled glass sample to be tested. The influence of non-uniform sample melting and impurities brought in in the sample preparation process on the crystallization temperature test result can be avoided, and the accuracy of the crystallization temperature test result is improved.
本发明公开了一种高铝硅盖板玻璃析晶温度的测试方法，该测试方法包括以下步骤：将待测试玻璃样品进行预处理；将预处理完成的待测试玻璃样品通过铂金舟放入梯温炉中，保温24h及以上；保温完成之后，将待测试玻璃样品取出冷却；对冷却后的待测试玻璃样品进行观察。能够避免因熔样不均及制样过程中带入杂质对析晶温度测试结果的影响，提高了析晶温度测试结果的准确性。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyj0KwkAQQOE0FqLeYTxAIFEIthIUG61srMKwTpKB2R92JoKe3hQewOrB41sWjyvZGJ_QxwxGahwGcPmthiL8QeMY5u8TZbQpE8QeRh7GEmXyHCZfKgu7Gbn4ogxJ0AgGQdV1sehRlDa_rort-XRvLyWl2JEmdBTIuvZW103VHKp6d9z_Y75jbDuJ</recordid><startdate>20230505</startdate><enddate>20230505</enddate><creator>TANG BINGJIE</creator><creator>XUE XINJIAN</creator><creator>FAN JING</creator><creator>MA YUFEI</creator><creator>LIU YINGZHOU</creator><creator>NIU TAOXIA</creator><scope>EVB</scope></search><sort><creationdate>20230505</creationdate><title>Method for testing crystallization temperature of high-aluminum-silicon cover plate glass</title><author>TANG BINGJIE ; XUE XINJIAN ; FAN JING ; MA YUFEI ; LIU YINGZHOU ; NIU TAOXIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116068012A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TANG BINGJIE</creatorcontrib><creatorcontrib>XUE XINJIAN</creatorcontrib><creatorcontrib>FAN JING</creatorcontrib><creatorcontrib>MA YUFEI</creatorcontrib><creatorcontrib>LIU YINGZHOU</creatorcontrib><creatorcontrib>NIU TAOXIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TANG BINGJIE</au><au>XUE XINJIAN</au><au>FAN JING</au><au>MA YUFEI</au><au>LIU YINGZHOU</au><au>NIU TAOXIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for testing crystallization temperature of high-aluminum-silicon cover plate glass</title><date>2023-05-05</date><risdate>2023</risdate><abstract>The invention discloses a method for testing the crystallization temperature of high-aluminum-silicon cover plate glass. The testing method comprises the following steps: pretreating a to-be-tested glass sample; putting the pretreated to-be-tested glass sample into a gradient temperature furnace through a platinum boat, and preserving heat for 24 hours or more; after heat preservation is completed, taking out the glass sample to be tested and cooling; and observing the cooled glass sample to be tested. The influence of non-uniform sample melting and impurities brought in in the sample preparation process on the crystallization temperature test result can be avoided, and the accuracy of the crystallization temperature test result is improved.
本发明公开了一种高铝硅盖板玻璃析晶温度的测试方法，该测试方法包括以下步骤：将待测试玻璃样品进行预处理；将预处理完成的待测试玻璃样品通过铂金舟放入梯温炉中，保温24h及以上；保温完成之后，将待测试玻璃样品取出冷却；对冷却后的待测试玻璃样品进行观察。能够避免因熔样不均及制样过程中带入杂质对析晶温度测试结果的影响，提高了析晶温度测试结果的准确性。</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN116068012A |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Method for testing crystallization temperature of high-aluminum-silicon cover plate glass |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T07%3A46%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TANG%20BINGJIE&rft.date=2023-05-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116068012A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |