Equipment inspection method and device, electronic equipment and storage medium
The invention relates to the technical field of equipment management, and provides an equipment inspection method and device, electronic equipment and a storage medium. Inputting the equipment index data into an equipment state prediction model to obtain an equipment state prediction result output b...
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| creator | HAN JIPU CHENG PENG SUN JUNWEI |
| description | The invention relates to the technical field of equipment management, and provides an equipment inspection method and device, electronic equipment and a storage medium. Inputting the equipment index data into an equipment state prediction model to obtain an equipment state prediction result output by the equipment state prediction model; wherein the equipment state prediction model is used for predicting the equipment state according to the equipment index data; and performing state management on the to-be-detected equipment based on the equipment state prediction result. According to the method and the device, the device index data of the to-be-detected device can be automatically acquired, and the device state prediction result of the to-be-detected device can be accurately obtained by performing state prediction on the device index data through the device state prediction model, so that state management can be further performed on the to-be-detected device according to the device state prediction result; t |
| format | Patent |
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Inputting the equipment index data into an equipment state prediction model to obtain an equipment state prediction result output by the equipment state prediction model; wherein the equipment state prediction model is used for predicting the equipment state according to the equipment index data; and performing state management on the to-be-detected equipment based on the equipment state prediction result. According to the method and the device, the device index data of the to-be-detected device can be automatically acquired, and the device state prediction result of the to-be-detected device can be accurately obtained by performing state prediction on the device index data through the device state prediction model, so that state management can be further performed on the to-be-detected device according to the device state prediction result; t</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230502&DB=EPODOC&CC=CN&NR=116051072A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230502&DB=EPODOC&CC=CN&NR=116051072A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAN JIPU</creatorcontrib><creatorcontrib>CHENG PENG</creatorcontrib><creatorcontrib>SUN JUNWEI</creatorcontrib><title>Equipment inspection method and device, electronic equipment and storage medium</title><description>The invention relates to the technical field of equipment management, and provides an equipment inspection method and device, electronic equipment and a storage medium. Inputting the equipment index data into an equipment state prediction model to obtain an equipment state prediction result output by the equipment state prediction model; wherein the equipment state prediction model is used for predicting the equipment state according to the equipment index data; and performing state management on the to-be-detected equipment based on the equipment state prediction result. According to the method and the device, the device index data of the to-be-detected device can be automatically acquired, and the device state prediction result of the to-be-detected device can be accurately obtained by performing state prediction on the device index data through the device state prediction model, so that state management can be further performed on the to-be-detected device according to the device state prediction result; t</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizELwjAUBrM4iPofnrtCo6izlEonXdxLSD7rg-YlNqm_vxXE2emGu5urW_UaOHpIJpYUYTMHIY_8DI6MOHJ4s8WG0E2uD8KW8Fs-QcqhNy2mx_Hgl2r2MF3C6suFWl-qe1lvEUODFI2FIDflVetjcdDFaXfe_9OMhtY3MQ</recordid><startdate>20230502</startdate><enddate>20230502</enddate><creator>HAN JIPU</creator><creator>CHENG PENG</creator><creator>SUN JUNWEI</creator><scope>EVB</scope></search><sort><creationdate>20230502</creationdate><title>Equipment inspection method and device, electronic equipment and storage medium</title><author>HAN JIPU ; CHENG PENG ; SUN JUNWEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116051072A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>HAN JIPU</creatorcontrib><creatorcontrib>CHENG PENG</creatorcontrib><creatorcontrib>SUN JUNWEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAN JIPU</au><au>CHENG PENG</au><au>SUN JUNWEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Equipment inspection method and device, electronic equipment and storage medium</title><date>2023-05-02</date><risdate>2023</risdate><abstract>The invention relates to the technical field of equipment management, and provides an equipment inspection method and device, electronic equipment and a storage medium. Inputting the equipment index data into an equipment state prediction model to obtain an equipment state prediction result output by the equipment state prediction model; wherein the equipment state prediction model is used for predicting the equipment state according to the equipment index data; and performing state management on the to-be-detected equipment based on the equipment state prediction result. According to the method and the device, the device index data of the to-be-detected device can be automatically acquired, and the device state prediction result of the to-be-detected device can be accurately obtained by performing state prediction on the device index data through the device state prediction model, so that state management can be further performed on the to-be-detected device according to the device state prediction result; t</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | Equipment inspection method and device, electronic equipment and storage medium |
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