System for automatically generating test question template

The invention discloses a system for automatically generating a test question template, and belongs to the technical field of intelligent education. According to the system, when and only when required question position information is complete, a question position template in a test question is gene...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: CHANG WEIYUAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHANG WEIYUAN
description The invention discloses a system for automatically generating a test question template, and belongs to the technical field of intelligent education. According to the system, when and only when required question position information is complete, a question position template in a test question is generated at a question position of a test question template; namely, the question position template simultaneously comprises question position information of a test question module, question position information of a sequence, question position information of a basic question type library, question position information of a category to which knowledge belongs, question position information of a knowledge point combination and question position information of a subject ability item combination. When the required value of the test question template is reached, forming a to-be-tested set question; the to-be-tested set questions are converged through convergence rules, whether the to-be-tested set questions meet convergen
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116050365A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116050365A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116050365A3</originalsourceid><addsrcrecordid>eNrjZLAKriwuSc1VSMsvUkgsLcnPTSzJTE7MyalUSE_NSy0C8vLSFUpSi0sUCkuBZGZ-HpCXW5CTWJLKw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwsSk4EmlMQ7-xkamhmYGhibmToaE6MGANVuL9Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System for automatically generating test question template</title><source>esp@cenet</source><creator>CHANG WEIYUAN</creator><creatorcontrib>CHANG WEIYUAN</creatorcontrib><description>The invention discloses a system for automatically generating a test question template, and belongs to the technical field of intelligent education. According to the system, when and only when required question position information is complete, a question position template in a test question is generated at a question position of a test question template; namely, the question position template simultaneously comprises question position information of a test question module, question position information of a sequence, question position information of a basic question type library, question position information of a category to which knowledge belongs, question position information of a knowledge point combination and question position information of a subject ability item combination. When the required value of the test question template is reached, forming a to-be-tested set question; the to-be-tested set questions are converged through convergence rules, whether the to-be-tested set questions meet convergen</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230502&amp;DB=EPODOC&amp;CC=CN&amp;NR=116050365A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230502&amp;DB=EPODOC&amp;CC=CN&amp;NR=116050365A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHANG WEIYUAN</creatorcontrib><title>System for automatically generating test question template</title><description>The invention discloses a system for automatically generating a test question template, and belongs to the technical field of intelligent education. According to the system, when and only when required question position information is complete, a question position template in a test question is generated at a question position of a test question template; namely, the question position template simultaneously comprises question position information of a test question module, question position information of a sequence, question position information of a basic question type library, question position information of a category to which knowledge belongs, question position information of a knowledge point combination and question position information of a subject ability item combination. When the required value of the test question template is reached, forming a to-be-tested set question; the to-be-tested set questions are converged through convergence rules, whether the to-be-tested set questions meet convergen</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAKriwuSc1VSMsvUkgsLcnPTSzJTE7MyalUSE_NSy0C8vLSFUpSi0sUCkuBZGZ-HpCXW5CTWJLKw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwsSk4EmlMQ7-xkamhmYGhibmToaE6MGANVuL9Q</recordid><startdate>20230502</startdate><enddate>20230502</enddate><creator>CHANG WEIYUAN</creator><scope>EVB</scope></search><sort><creationdate>20230502</creationdate><title>System for automatically generating test question template</title><author>CHANG WEIYUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116050365A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CHANG WEIYUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHANG WEIYUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System for automatically generating test question template</title><date>2023-05-02</date><risdate>2023</risdate><abstract>The invention discloses a system for automatically generating a test question template, and belongs to the technical field of intelligent education. According to the system, when and only when required question position information is complete, a question position template in a test question is generated at a question position of a test question template; namely, the question position template simultaneously comprises question position information of a test question module, question position information of a sequence, question position information of a basic question type library, question position information of a category to which knowledge belongs, question position information of a knowledge point combination and question position information of a subject ability item combination. When the required value of the test question template is reached, forming a to-be-tested set question; the to-be-tested set questions are converged through convergence rules, whether the to-be-tested set questions meet convergen</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN116050365A
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
title System for automatically generating test question template
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T08%3A22%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHANG%20WEIYUAN&rft.date=2023-05-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116050365A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true