Chip system testing method and device, electronic equipment and storage medium

The embodiment of the invention relates to the technical field of production testing, and discloses a system testing method and device for a chip, electronic equipment and a storage medium, and the method comprises the steps that testing information is configured for a to-be-tested chip, and the tes...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN HAO, JIA ZHANJIE, HUANG XUEBING, ZHENG MINGCHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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