Chip system testing method and device, electronic equipment and storage medium

Chip system testing method and device, electronic equipment and storage medium

The embodiment of the invention relates to the technical field of production testing, and discloses a system testing method and device for a chip, electronic equipment and a storage medium, and the method comprises the steps that testing information is configured for a to-be-tested chip, and the tes...

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Hauptverfasser: CHEN HAO, JIA ZHANJIE, HUANG XUEBING, ZHENG MINGCHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator CHEN HAO
JIA ZHANJIE
HUANG XUEBING
ZHENG MINGCHENG
description The embodiment of the invention relates to the technical field of production testing, and discloses a system testing method and device for a chip, electronic equipment and a storage medium, and the method comprises the steps that testing information is configured for a to-be-tested chip, and the testing information at least comprises a register configuration file and testing items needing to be carried out; loading and analyzing the register configuration file, generating a test configuration list, and generating a test case according to the test configuration list and the test items; determining each first register corresponding to the test case, and operating each first register through a pre-created standard API interface corresponding to each first register and configuration parameters of each first register under the test case in the test configuration list so as to execute the test case; according to the method, the preset measuring instrument is called to measure the to-be-tested chip, and the test res
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Chip system testing method and device, electronic equipment and storage medium
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