Device surface crack detection method and system and electronic equipment
The invention discloses a device surface crack detection method and system and electronic equipment, and relates to the technical field of computer vision. According to the device surface crack detection method provided by the invention, crack detection is carried out on the device image through the...
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| creator | REN XINGHUA MAI ZIYING HU SHAOLIN QIN CHUNBIN HOU YANDONG KE YE |
| description | The invention discloses a device surface crack detection method and system and electronic equipment, and relates to the technical field of computer vision. According to the device surface crack detection method provided by the invention, crack detection is carried out on the device image through the network model obtained by adopting the SSD model after data set training and improvement, the problems of insufficient feature extraction and low small target detection rate when the SSD model is adopted for crack detection in the prior art can be solved, and the detection efficiency is improved. According to the method, morphological processing is performed on the image, so that the characteristics of the cracks can be enhanced, and the purpose of greatly improving the detection accuracy of the cracks on the surface of the device is achieved.
本发明公开一种器件表面裂纹检测方法、系统及电子设备，涉及计算机视觉技术领域。本发明提供的器件表面裂纹检测方法，通过采用数据集训练改进后的SSD模型得到的网络模型对器件图像进行裂纹检测，能够解决现有技术中采用SSD模型进行裂纹检测提取特征不充分、小目标检测率低的问题，并且，本发明通过对图像进行形态学处理，能够增强裂纹的特征，进而实现大幅提高器件表 |
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本发明公开一种器件表面裂纹检测方法、系统及电子设备，涉及计算机视觉技术领域。本发明提供的器件表面裂纹检测方法，通过采用数据集训练改进后的SSD模型得到的网络模型对器件图像进行裂纹检测，能够解决现有技术中采用SSD模型进行裂纹检测提取特征不充分、小目标检测率低的问题，并且，本发明通过对图像进行形态学处理，能够增强裂纹的特征，进而实现大幅提高器件表</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230414&DB=EPODOC&CC=CN&NR=115965620A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25573,76557</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230414&DB=EPODOC&CC=CN&NR=115965620A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>REN XINGHUA</creatorcontrib><creatorcontrib>MAI ZIYING</creatorcontrib><creatorcontrib>HU SHAOLIN</creatorcontrib><creatorcontrib>QIN CHUNBIN</creatorcontrib><creatorcontrib>HOU YANDONG</creatorcontrib><creatorcontrib>KE YE</creatorcontrib><title>Device surface crack detection method and system and electronic equipment</title><description>The invention discloses a device surface crack detection method and system and electronic equipment, and relates to the technical field of computer vision. According to the device surface crack detection method provided by the invention, crack detection is carried out on the device image through the network model obtained by adopting the SSD model after data set training and improvement, the problems of insufficient feature extraction and low small target detection rate when the SSD model is adopted for crack detection in the prior art can be solved, and the detection efficiency is improved. According to the method, morphological processing is performed on the image, so that the characteristics of the cracks can be enhanced, and the purpose of greatly improving the detection accuracy of the cracks on the surface of the device is achieved.
本发明公开一种器件表面裂纹检测方法、系统及电子设备，涉及计算机视觉技术领域。本发明提供的器件表面裂纹检测方法，通过采用数据集训练改进后的SSD模型得到的网络模型对器件图像进行裂纹检测，能够解决现有技术中采用SSD模型进行裂纹检测提取特征不充分、小目标检测率低的问题，并且，本发明通过对图像进行形态学处理，能够增强裂纹的特征，进而实现大幅提高器件表</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPB0SS3LTE5VKC4tSksE0slFicnZCimpJanJJZn5eQq5qSUZ-SkKiXkpCsWVxSWpuWBmag5Quig_LzNZIbWwNLMgNzWvhIeBNS0xpziVF0pzMyi6uYY4e-imFuTHpxYXAE3PSy2Jd_YzNDS1NDM1MzJwNCZGDQDrXjTe</recordid><startdate>20230414</startdate><enddate>20230414</enddate><creator>REN XINGHUA</creator><creator>MAI ZIYING</creator><creator>HU SHAOLIN</creator><creator>QIN CHUNBIN</creator><creator>HOU YANDONG</creator><creator>KE YE</creator><scope>EVB</scope></search><sort><creationdate>20230414</creationdate><title>Device surface crack detection method and system and electronic equipment</title><author>REN XINGHUA ; MAI ZIYING ; HU SHAOLIN ; QIN CHUNBIN ; HOU YANDONG ; KE YE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115965620A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>REN XINGHUA</creatorcontrib><creatorcontrib>MAI ZIYING</creatorcontrib><creatorcontrib>HU SHAOLIN</creatorcontrib><creatorcontrib>QIN CHUNBIN</creatorcontrib><creatorcontrib>HOU YANDONG</creatorcontrib><creatorcontrib>KE YE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>REN XINGHUA</au><au>MAI ZIYING</au><au>HU SHAOLIN</au><au>QIN CHUNBIN</au><au>HOU YANDONG</au><au>KE YE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device surface crack detection method and system and electronic equipment</title><date>2023-04-14</date><risdate>2023</risdate><abstract>The invention discloses a device surface crack detection method and system and electronic equipment, and relates to the technical field of computer vision. According to the device surface crack detection method provided by the invention, crack detection is carried out on the device image through the network model obtained by adopting the SSD model after data set training and improvement, the problems of insufficient feature extraction and low small target detection rate when the SSD model is adopted for crack detection in the prior art can be solved, and the detection efficiency is improved. According to the method, morphological processing is performed on the image, so that the characteristics of the cracks can be enhanced, and the purpose of greatly improving the detection accuracy of the cracks on the surface of the device is achieved.
本发明公开一种器件表面裂纹检测方法、系统及电子设备，涉及计算机视觉技术领域。本发明提供的器件表面裂纹检测方法，通过采用数据集训练改进后的SSD模型得到的网络模型对器件图像进行裂纹检测，能够解决现有技术中采用SSD模型进行裂纹检测提取特征不充分、小目标检测率低的问题，并且，本发明通过对图像进行形态学处理，能够增强裂纹的特征，进而实现大幅提高器件表</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | Device surface crack detection method and system and electronic equipment |
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