Wall thickness calculation and analysis method and system
The invention relates to a wall thickness calculation and analysis method and system, and relates to the field of pipeline wall thickness measurement calculation, and the pipeline wall thickness acquisition method comprises the steps: S1, obtaining a thickness measurement original data set, S2, obta...
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| creator | CHEN GANG ZHOU RUILAN |
| description | The invention relates to a wall thickness calculation and analysis method and system, and relates to the field of pipeline wall thickness measurement calculation, and the pipeline wall thickness acquisition method comprises the steps: S1, obtaining a thickness measurement original data set, S2, obtaining a compensation correction value, S3, obtaining a thickness measurement candidate data set, S4, judging whether the thickness measurement candidate data set has a unique mode, S5, judging whether the thickness measurement candidate data set has a unique mode, and S5, judging whether the thickness measurement candidate data set has a unique mode. According to the wall thickness calculation and analysis method and system, a pipeline wall thickness obtaining system is used for obtaining a target pipeline wall thickness value, the pipeline wall thickness obtaining system comprises a thickness gauge, a cloud processor and a pipeline wall thickness obtaining device, and the cloud processor comprises a thickness meas |
| format | Patent |
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| language | chi ; eng |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Wall thickness calculation and analysis method and system |
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