System and method for testing temperature-dependent reliability of radio frequency device

System and method for testing temperature-dependent reliability of radio frequency device

A temperature-dependent reliability test system for a radio frequency device is used for the radio frequency device to execute a temperature-dependent reliability test, and comprises a temperature control chamber, at least one temperature sensor and a control unit. The control unit comprises a proce...

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1. Verfasser: ZENG QICHENG
Format: Patent
Sprache:chi ; eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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description A temperature-dependent reliability test system for a radio frequency device is used for the radio frequency device to execute a temperature-dependent reliability test, and comprises a temperature control chamber, at least one temperature sensor and a control unit. The control unit comprises a processor and a storage medium, wherein the storage medium provides a temperature-dependent reliability test program. During a debugging period before entering a temperature-dependent reliability test, the control unit is used for reading and evaluating a debugging temperature based on a temperature-dependent reliability test program, and the debugging temperature is sensed by the temperature sensor; and adjusting at least one electrical parameter of the radio frequency device according to the debugging temperature so as to determine an electrical parameter meeting the temperature condition of the temperature-related reliability test. Therefore, the radio frequency device can be protected in the temperature-dependent re
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title System and method for testing temperature-dependent reliability of radio frequency device
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