Apparatus and method for estimating thickness of sediment, and non-transitory computer-readable recording medium
The present disclosure provides an estimation apparatus including a controller that: acquires a first pipe surface temperature, which is an outer surface temperature at a sediment generation location of a pipe through which a fluid flows, and a second pipe surface temperature, which is an outer surf...
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| creator | TANAKA YOSHIAKI IHARA TOMONORI HATSUKU TATSUYA ITO SHUMPEI MORITA MOTOAKI |
| description | The present disclosure provides an estimation apparatus including a controller that: acquires a first pipe surface temperature, which is an outer surface temperature at a sediment generation location of a pipe through which a fluid flows, and a second pipe surface temperature, which is an outer surface temperature at a sediment generation location of the pipe through which the fluid flows; the second pipeline surface temperature is a second pipeline surface temperature at a sediment generation position at which the sediment adheres to an inner surface of the pipeline, and the second pipeline surface temperature is an outer surface temperature of the pipeline at a reference position different from the sediment generation position; calculating an in-pipe fluid temperature based on the second pipe surface temperature, the in-pipe fluid temperature being a temperature of the fluid at the sediment generation location; and estimating the thickness of the sediment based on the in-pipe fluid temperature and the first |
| format | Patent |
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the second pipeline surface temperature is a second pipeline surface temperature at a sediment generation position at which the sediment adheres to an inner surface of the pipeline, and the second pipeline surface temperature is an outer surface temperature of the pipeline at a reference position different from the sediment generation position; calculating an in-pipe fluid temperature based on the second pipe surface temperature, the in-pipe fluid temperature being a temperature of the fluid at the sediment generation location; and estimating the thickness of the sediment based on the in-pipe fluid temperature and the first</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230407&DB=EPODOC&CC=CN&NR=115930874A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230407&DB=EPODOC&CC=CN&NR=115930874A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANAKA YOSHIAKI</creatorcontrib><creatorcontrib>IHARA TOMONORI</creatorcontrib><creatorcontrib>HATSUKU TATSUYA</creatorcontrib><creatorcontrib>ITO SHUMPEI</creatorcontrib><creatorcontrib>MORITA MOTOAKI</creatorcontrib><title>Apparatus and method for estimating thickness of sediment, and non-transitory computer-readable recording medium</title><description>The present disclosure provides an estimation apparatus including a controller that: acquires a first pipe surface temperature, which is an outer surface temperature at a sediment generation location of a pipe through which a fluid flows, and a second pipe surface temperature, which is an outer surface temperature at a sediment generation location of the pipe through which the fluid flows; the second pipeline surface temperature is a second pipeline surface temperature at a sediment generation position at which the sediment adheres to an inner surface of the pipeline, and the second pipeline surface temperature is an outer surface temperature of the pipeline at a reference position different from the sediment generation position; calculating an in-pipe fluid temperature based on the second pipe surface temperature, the in-pipe fluid temperature being a temperature of the fluid at the sediment generation location; and estimating the thickness of the sediment based on the in-pipe fluid temperature and the first</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLsOwjAMALswIOAfzE4lqoKAsapATEzslWlcGtHYUewO_D0P8QFMt9zdNItVjJjQRgVkB4GsFwedJCA1H9A838F63z6YVEE6UHI-ENvqG7BwbglZvUl6QishjkYpT4QObwNBolaS-1zCOxzDPJt0OCgtfpxly9PxWp9zitKQRmyJyZr6UhTbQ7ne7zZV-Y_zAqHzQ_4</recordid><startdate>20230407</startdate><enddate>20230407</enddate><creator>TANAKA YOSHIAKI</creator><creator>IHARA TOMONORI</creator><creator>HATSUKU TATSUYA</creator><creator>ITO SHUMPEI</creator><creator>MORITA MOTOAKI</creator><scope>EVB</scope></search><sort><creationdate>20230407</creationdate><title>Apparatus and method for estimating thickness of sediment, and non-transitory computer-readable recording medium</title><author>TANAKA YOSHIAKI ; 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the second pipeline surface temperature is a second pipeline surface temperature at a sediment generation position at which the sediment adheres to an inner surface of the pipeline, and the second pipeline surface temperature is an outer surface temperature of the pipeline at a reference position different from the sediment generation position; calculating an in-pipe fluid temperature based on the second pipe surface temperature, the in-pipe fluid temperature being a temperature of the fluid at the sediment generation location; and estimating the thickness of the sediment based on the in-pipe fluid temperature and the first</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Apparatus and method for estimating thickness of sediment, and non-transitory computer-readable recording medium |
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