Detection method of reduction furnace in reduction workshop and related equipment
The embodiment of the invention provides a detection method for a reduction furnace in a reduction workshop and related equipment. The method comprises the following steps: acquiring first image information in a reduction furnace, wherein the first image information comprises a first image; performi...
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| creator | HU ZHENGKAI ZHANG XINGBAO YIN BO HOU YU LIU DANDAN WANG QIAN LIU XINGPING DONG YUEJIE |
| description | The embodiment of the invention provides a detection method for a reduction furnace in a reduction workshop and related equipment. The method comprises the following steps: acquiring first image information in a reduction furnace, wherein the first image information comprises a first image; performing binarization and connected domain processing on the first image to obtain a second image; comparing the second image with a first reference image in the reference image information, and determining whether the silicon rod in the reduction furnace has target abnormal information or not; and when the target abnormal information appears on the silicon rod, first prompt information is sent to a management control platform. Therefore, the growth conditions of the silicon rods in the reduction furnace are automatically identified, so that the growth conditions of the silicon rods in a plurality of reduction furnaces do not need to be identified one by one manually, and the timeliness of identifying the abnormal growth |
| format | Patent |
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The method comprises the following steps: acquiring first image information in a reduction furnace, wherein the first image information comprises a first image; performing binarization and connected domain processing on the first image to obtain a second image; comparing the second image with a first reference image in the reference image information, and determining whether the silicon rod in the reduction furnace has target abnormal information or not; and when the target abnormal information appears on the silicon rod, first prompt information is sent to a management control platform. 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The method comprises the following steps: acquiring first image information in a reduction furnace, wherein the first image information comprises a first image; performing binarization and connected domain processing on the first image to obtain a second image; comparing the second image with a first reference image in the reference image information, and determining whether the silicon rod in the reduction furnace has target abnormal information or not; and when the target abnormal information appears on the silicon rod, first prompt information is sent to a management control platform. Therefore, the growth conditions of the silicon rods in the reduction furnace are automatically identified, so that the growth conditions of the silicon rods in a plurality of reduction furnaces do not need to be identified one by one manually, and the timeliness of identifying the abnormal growth</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Detection method of reduction furnace in reduction workshop and related equipment |
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