Application testing method, device and system

The invention provides an application test method, device and system, which can be used in the technical field of artificial intelligence, and the method comprises the following steps: receiving a test request transmitted by a test terminal, and determining a corresponding test type according to the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LUO BINGAN, ZHU LEHE, YE YUTANG, HONG HUANJIANG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides an application test method, device and system, which can be used in the technical field of artificial intelligence, and the method comprises the following steps: receiving a test request transmitted by a test terminal, and determining a corresponding test type according to the test request; if the test type is function test, transmitting the test request to a to-be-tested application for function test to obtain a function test result; if the test type is an automatic test, transmitting the test request to a to-be-tested application for automatic test, and if a service calling request sent by the to-be-tested application is obtained, transmitting the test request to the to-be-tested application for automatic test; and transmitting the service calling request to a corresponding baffle program to enable the baffle program to perform request processing to obtain a processing result, and returning the processing result to the to-be-tested application. The method supports the operation of the