Test equipment and test method

Test equipment and test method

The invention relates to the technical field of product testing, in particular to testing equipment and a testing method. A test apparatus includes a test assembly and a processing assembly. The test assembly comprises a clamping and fixing device, a test device and a data transmission device, the c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WANG ZESI, LIU GUOQING
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WANG ZESI
LIU GUOQING
description The invention relates to the technical field of product testing, in particular to testing equipment and a testing method. A test apparatus includes a test assembly and a processing assembly. The test assembly comprises a clamping and fixing device, a test device and a data transmission device, the clamping and fixing device comprises a clamping and fixing mechanism and a first moving mechanism, and the first moving mechanism drives the clamping and fixing mechanism to move in a first direction; the test device comprises a first test tool assembly and a second test tool assembly which can move relative to a test product; the data transmission device is connected with the test product; and the processing assembly is used for receiving the data of the test product and controlling the test assembly to operate. The test equipment has the following advantages that automatic test operation of multiple test items and multiple types of products is carried out according to the preset parameters, the test items and the
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115856487A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115856487A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115856487A3</originalsourceid><addsrcrecordid>eNrjZJALSS0uUUgtLM0syE3NK1FIzEtRKAEJ5aaWZOSn8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NTC1MzEwtzR2Ni1AAA9f0kiw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test equipment and test method</title><source>esp@cenet</source><creator>WANG ZESI ; LIU GUOQING</creator><creatorcontrib>WANG ZESI ; LIU GUOQING</creatorcontrib><description>The invention relates to the technical field of product testing, in particular to testing equipment and a testing method. A test apparatus includes a test assembly and a processing assembly. The test assembly comprises a clamping and fixing device, a test device and a data transmission device, the clamping and fixing device comprises a clamping and fixing mechanism and a first moving mechanism, and the first moving mechanism drives the clamping and fixing mechanism to move in a first direction; the test device comprises a first test tool assembly and a second test tool assembly which can move relative to a test product; the data transmission device is connected with the test product; and the processing assembly is used for receiving the data of the test product and controlling the test assembly to operate. The test equipment has the following advantages that automatic test operation of multiple test items and multiple types of products is carried out according to the preset parameters, the test items and the</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230328&amp;DB=EPODOC&amp;CC=CN&amp;NR=115856487A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230328&amp;DB=EPODOC&amp;CC=CN&amp;NR=115856487A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG ZESI</creatorcontrib><creatorcontrib>LIU GUOQING</creatorcontrib><title>Test equipment and test method</title><description>The invention relates to the technical field of product testing, in particular to testing equipment and a testing method. A test apparatus includes a test assembly and a processing assembly. The test assembly comprises a clamping and fixing device, a test device and a data transmission device, the clamping and fixing device comprises a clamping and fixing mechanism and a first moving mechanism, and the first moving mechanism drives the clamping and fixing mechanism to move in a first direction; the test device comprises a first test tool assembly and a second test tool assembly which can move relative to a test product; the data transmission device is connected with the test product; and the processing assembly is used for receiving the data of the test product and controlling the test assembly to operate. The test equipment has the following advantages that automatic test operation of multiple test items and multiple types of products is carried out according to the preset parameters, the test items and the</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJALSS0uUUgtLM0syE3NK1FIzEtRKAEJ5aaWZOSn8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NTC1MzEwtzR2Ni1AAA9f0kiw</recordid><startdate>20230328</startdate><enddate>20230328</enddate><creator>WANG ZESI</creator><creator>LIU GUOQING</creator><scope>EVB</scope></search><sort><creationdate>20230328</creationdate><title>Test equipment and test method</title><author>WANG ZESI ; LIU GUOQING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115856487A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG ZESI</creatorcontrib><creatorcontrib>LIU GUOQING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG ZESI</au><au>LIU GUOQING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test equipment and test method</title><date>2023-03-28</date><risdate>2023</risdate><abstract>The invention relates to the technical field of product testing, in particular to testing equipment and a testing method. A test apparatus includes a test assembly and a processing assembly. The test assembly comprises a clamping and fixing device, a test device and a data transmission device, the clamping and fixing device comprises a clamping and fixing mechanism and a first moving mechanism, and the first moving mechanism drives the clamping and fixing mechanism to move in a first direction; the test device comprises a first test tool assembly and a second test tool assembly which can move relative to a test product; the data transmission device is connected with the test product; and the processing assembly is used for receiving the data of the test product and controlling the test assembly to operate. The test equipment has the following advantages that automatic test operation of multiple test items and multiple types of products is carried out according to the preset parameters, the test items and the</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN115856487A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test equipment and test method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T09%3A09%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANG%20ZESI&rft.date=2023-03-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115856487A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true