TR assembly testing device and method

TR assembly testing device and method

The invention relates to a TR assembly testing technology, and discloses a TR assembly testing device and method, which realize loading and testing of radio frequency signals through a dot frequency signal source, a centimeter network, an input/output detector and a wave control module. According to...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HE TINGYU, LIAO JIAN, BU JIANMING, CHAI JUNBIAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HE TINGYU
LIAO JIAN
BU JIANMING
CHAI JUNBIAO
description The invention relates to a TR assembly testing technology, and discloses a TR assembly testing device and method, which realize loading and testing of radio frequency signals through a dot frequency signal source, a centimeter network, an input/output detector and a wave control module. According to the invention, a single-module power supply mode and an independent temperature control mode are integrated, direct current loading of a DUT and independent control of a DUT temperature platform are realized, and interference between stations is reduced as much as possible; a microwave load time division multiplexing technology is adopted, radio frequency outputs of a plurality of TR assemblies are connected to the same attenuator, and meanwhile, the radio frequency output of each channel of each TR assembly is detected through a program control mode of a wave control signal, so that the reliability test requirements of low cost and full detection coverage are met. 本发明涉及TR组件测试技术，公开了一种TR组件的测试装置和方法，其通过点频信号源、公分网络、输入输
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115825621A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115825621A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115825621A3</originalsourceid><addsrcrecordid>eNrjZFANCVJILC5OzU3KqVQoSS0uycxLV0hJLctMTlVIzEtRyE0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoamFkamZkaGjsbEqAEAGsYm0g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TR assembly testing device and method</title><source>esp@cenet</source><creator>HE TINGYU ; LIAO JIAN ; BU JIANMING ; CHAI JUNBIAO</creator><creatorcontrib>HE TINGYU ; LIAO JIAN ; BU JIANMING ; CHAI JUNBIAO</creatorcontrib><description>The invention relates to a TR assembly testing technology, and discloses a TR assembly testing device and method, which realize loading and testing of radio frequency signals through a dot frequency signal source, a centimeter network, an input/output detector and a wave control module. According to the invention, a single-module power supply mode and an independent temperature control mode are integrated, direct current loading of a DUT and independent control of a DUT temperature platform are realized, and interference between stations is reduced as much as possible; a microwave load time division multiplexing technology is adopted, radio frequency outputs of a plurality of TR assemblies are connected to the same attenuator, and meanwhile, the radio frequency output of each channel of each TR assembly is detected through a program control mode of a wave control signal, so that the reliability test requirements of low cost and full detection coverage are met. 本发明涉及TR组件测试技术，公开了一种TR组件的测试装置和方法，其通过点频信号源、公分网络、输入输</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230321&amp;DB=EPODOC&amp;CC=CN&amp;NR=115825621A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230321&amp;DB=EPODOC&amp;CC=CN&amp;NR=115825621A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HE TINGYU</creatorcontrib><creatorcontrib>LIAO JIAN</creatorcontrib><creatorcontrib>BU JIANMING</creatorcontrib><creatorcontrib>CHAI JUNBIAO</creatorcontrib><title>TR assembly testing device and method</title><description>The invention relates to a TR assembly testing technology, and discloses a TR assembly testing device and method, which realize loading and testing of radio frequency signals through a dot frequency signal source, a centimeter network, an input/output detector and a wave control module. According to the invention, a single-module power supply mode and an independent temperature control mode are integrated, direct current loading of a DUT and independent control of a DUT temperature platform are realized, and interference between stations is reduced as much as possible; a microwave load time division multiplexing technology is adopted, radio frequency outputs of a plurality of TR assemblies are connected to the same attenuator, and meanwhile, the radio frequency output of each channel of each TR assembly is detected through a program control mode of a wave control signal, so that the reliability test requirements of low cost and full detection coverage are met. 本发明涉及TR组件测试技术，公开了一种TR组件的测试装置和方法，其通过点频信号源、公分网络、输入输</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFANCVJILC5OzU3KqVQoSS0uycxLV0hJLctMTlVIzEtRyE0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoamFkamZkaGjsbEqAEAGsYm0g</recordid><startdate>20230321</startdate><enddate>20230321</enddate><creator>HE TINGYU</creator><creator>LIAO JIAN</creator><creator>BU JIANMING</creator><creator>CHAI JUNBIAO</creator><scope>EVB</scope></search><sort><creationdate>20230321</creationdate><title>TR assembly testing device and method</title><author>HE TINGYU ; LIAO JIAN ; BU JIANMING ; CHAI JUNBIAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115825621A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HE TINGYU</creatorcontrib><creatorcontrib>LIAO JIAN</creatorcontrib><creatorcontrib>BU JIANMING</creatorcontrib><creatorcontrib>CHAI JUNBIAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HE TINGYU</au><au>LIAO JIAN</au><au>BU JIANMING</au><au>CHAI JUNBIAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TR assembly testing device and method</title><date>2023-03-21</date><risdate>2023</risdate><abstract>The invention relates to a TR assembly testing technology, and discloses a TR assembly testing device and method, which realize loading and testing of radio frequency signals through a dot frequency signal source, a centimeter network, an input/output detector and a wave control module. According to the invention, a single-module power supply mode and an independent temperature control mode are integrated, direct current loading of a DUT and independent control of a DUT temperature platform are realized, and interference between stations is reduced as much as possible; a microwave load time division multiplexing technology is adopted, radio frequency outputs of a plurality of TR assemblies are connected to the same attenuator, and meanwhile, the radio frequency output of each channel of each TR assembly is detected through a program control mode of a wave control signal, so that the reliability test requirements of low cost and full detection coverage are met. 本发明涉及TR组件测试技术，公开了一种TR组件的测试装置和方法，其通过点频信号源、公分网络、输入输</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN115825621A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title TR assembly testing device and method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T11%3A55%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HE%20TINGYU&rft.date=2023-03-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115825621A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true