Test system and test method

The invention provides a test system and a test method. The test system comprises an electronic device and a test device. The electronic device comprises a processor. The testing device comprises a plurality of sensors and a controller. Each sensor senses an object to be measured to generate a corre...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LI SUZHEN, WANG CHAOJING, LIU ZHIROU, CAI CANGXIANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!