Defect identification digital acceptance method and system based on image identification technology

The invention provides a defect identification digital acceptance method and system based on an image identification technology, and belongs to the technical field of digital acceptance. The method comprises the following steps: establishing an original three-dimensional model and an original two-di...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SU JICHEN, WANG DONG, XU BO, YE JIANQIANG, MA JUNLEI, LIANG JUN, CHANG MINGLIN, ZHANG XIAOCHEN, WANG HAORAN, LI NING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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