Absolute encoding measurment method using circular grating

Absolute encoding measurment method using circular grating

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Hauptverfasser: SHENGXIANG YE, JIJIAO WANG, AIMIN WEI
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator SHENGXIANG YE
JIJIAO WANG
AIMIN WEI
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language chi ; eng
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Absolute encoding measurment method using circular grating
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