Automatic test result analysis method and device

Automatic test result analysis method and device

The invention discloses an automatic test result analysis method and device, and relates to the technical field of big data, and the method comprises the steps: obtaining a test requirement file and a test script of to-be-tested software; executing the test script to obtain a test result; calculatin...

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Hauptverfasser: LIU SHU, LI JIA, GUO YOUGUANG, LIU HUI
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator LIU SHU
LI JIA
GUO YOUGUANG
LIU HUI
description The invention discloses an automatic test result analysis method and device, and relates to the technical field of big data, and the method comprises the steps: obtaining a test requirement file and a test script of to-be-tested software; executing the test script to obtain a test result; calculating an index value corresponding to a first test result analysis index of the to-be-tested software according to the identifiers of the plurality of first service functions and an identifier of a second service function carried by a test result of each test case; calculating an index value corresponding to a second test result analysis index of each second service function according to an identifier of the second service function carried by the test result and the test result of each test case; and determining an automatic test analysis result of the to-be-tested software according to the index value corresponding to the first test result analysis index of the to-be-tested software and the index value corresponding t
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Automatic test result analysis method and device
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