Detection system for nanoparticles and sample processing instrument

The invention relates to a detection system for nanoparticles and a sample processing instrument for nanoparticles. The detection system comprises a light emitting unit and a light collecting unit. The light emitting unit is configured to emit a light beam and project the light beam onto a nanoparticle to be detected. The light collection unit is configured to collect a light beam from the nanoparticles in order to analyze the nanoparticles from the collected light beam. The light emitting unit comprises a plurality of light sources and a focusing lens, and light beams emitted by the plurality of light sources are focused on the same detection position where the nano particles are to pass through through the focusing lens. 本公开涉及用于纳米粒子的检测系统和用于纳米粒子的样本处理仪。该检测系统包括光发射单元和光收集单元。所述光发射单元配置成发射光束并且将所述光束投射到待检测的纳米粒子上。所述光收集单元配置成从所述纳米粒子收集光束以便根据收集的光束对所述纳米粒子进行分析。所述光发射单元包括多个光源和聚焦透镜，所述多个光源发射的光束通过所述聚焦透镜聚焦于所述纳米粒子将要通过的同一检测位置。