Fitting defect detection method and device, storage medium and electronic equipment
The invention discloses a hardware fitting defect detection method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining an original image of a to-be-detected hardware fitting, processing the original image through a pre-trained target detection model,...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CAI WENBIAO ZHANG BO ZHOU XIAOMING WANG FEI ZHANG YONGBIAO ZHANG JIAYANG WANG FENGJUN QU XIAOHU DONG YUNPENG |
| description | The invention discloses a hardware fitting defect detection method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining an original image of a to-be-detected hardware fitting, processing the original image through a pre-trained target detection model, and obtaining a cross arm end front image and a wire end side image of the to-be-detected hardware fitting; performing edge detection on the cross arm end front image and the wire end side image to obtain cross arm end front geometric feature data and wire end side geometric feature data of the to-be-detected hardware fitting; and obtaining the wear degree of the to-be-tested fitting according to the cross arm end front geometric feature data and the wire end side geometric feature data. According to the method, the wear degree of the original image of the to-be-detected hardware fitting is identified and judged, the wear ratio of the to-be-detected hardware fitting is quantitatively calculated by using the geometr |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115713508A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115713508A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115713508A3</originalsourceid><addsrcrecordid>eNqNirEKwjAURbM4iPoPcVcwlKKrFIuTi-4lJLf1QfMSm1e_3yB-gNOBc85S3VsSIR60Rw8nBVJAkXWAPKPXln2Rb3LY6SxxsgNK8jSHb8JY9ikyOY3XTCmAZa0WvR0zNj-u1La9PJrrHil2yMk6MKRrbsbUR1PVh9O5-uf5AFAEOHA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Fitting defect detection method and device, storage medium and electronic equipment</title><source>esp@cenet</source><creator>CAI WENBIAO ; ZHANG BO ; ZHOU XIAOMING ; WANG FEI ; ZHANG YONGBIAO ; ZHANG JIAYANG ; WANG FENGJUN ; QU XIAOHU ; DONG YUNPENG</creator><creatorcontrib>CAI WENBIAO ; ZHANG BO ; ZHOU XIAOMING ; WANG FEI ; ZHANG YONGBIAO ; ZHANG JIAYANG ; WANG FENGJUN ; QU XIAOHU ; DONG YUNPENG</creatorcontrib><description>The invention discloses a hardware fitting defect detection method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining an original image of a to-be-detected hardware fitting, processing the original image through a pre-trained target detection model, and obtaining a cross arm end front image and a wire end side image of the to-be-detected hardware fitting; performing edge detection on the cross arm end front image and the wire end side image to obtain cross arm end front geometric feature data and wire end side geometric feature data of the to-be-detected hardware fitting; and obtaining the wear degree of the to-be-tested fitting according to the cross arm end front geometric feature data and the wire end side geometric feature data. According to the method, the wear degree of the original image of the to-be-detected hardware fitting is identified and judged, the wear ratio of the to-be-detected hardware fitting is quantitatively calculated by using the geometr</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230224&DB=EPODOC&CC=CN&NR=115713508A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230224&DB=EPODOC&CC=CN&NR=115713508A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAI WENBIAO</creatorcontrib><creatorcontrib>ZHANG BO</creatorcontrib><creatorcontrib>ZHOU XIAOMING</creatorcontrib><creatorcontrib>WANG FEI</creatorcontrib><creatorcontrib>ZHANG YONGBIAO</creatorcontrib><creatorcontrib>ZHANG JIAYANG</creatorcontrib><creatorcontrib>WANG FENGJUN</creatorcontrib><creatorcontrib>QU XIAOHU</creatorcontrib><creatorcontrib>DONG YUNPENG</creatorcontrib><title>Fitting defect detection method and device, storage medium and electronic equipment</title><description>The invention discloses a hardware fitting defect detection method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining an original image of a to-be-detected hardware fitting, processing the original image through a pre-trained target detection model, and obtaining a cross arm end front image and a wire end side image of the to-be-detected hardware fitting; performing edge detection on the cross arm end front image and the wire end side image to obtain cross arm end front geometric feature data and wire end side geometric feature data of the to-be-detected hardware fitting; and obtaining the wear degree of the to-be-tested fitting according to the cross arm end front geometric feature data and the wire end side geometric feature data. According to the method, the wear degree of the original image of the to-be-detected hardware fitting is identified and judged, the wear ratio of the to-be-detected hardware fitting is quantitatively calculated by using the geometr</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirEKwjAURbM4iPoPcVcwlKKrFIuTi-4lJLf1QfMSm1e_3yB-gNOBc85S3VsSIR60Rw8nBVJAkXWAPKPXln2Rb3LY6SxxsgNK8jSHb8JY9ikyOY3XTCmAZa0WvR0zNj-u1La9PJrrHil2yMk6MKRrbsbUR1PVh9O5-uf5AFAEOHA</recordid><startdate>20230224</startdate><enddate>20230224</enddate><creator>CAI WENBIAO</creator><creator>ZHANG BO</creator><creator>ZHOU XIAOMING</creator><creator>WANG FEI</creator><creator>ZHANG YONGBIAO</creator><creator>ZHANG JIAYANG</creator><creator>WANG FENGJUN</creator><creator>QU XIAOHU</creator><creator>DONG YUNPENG</creator><scope>EVB</scope></search><sort><creationdate>20230224</creationdate><title>Fitting defect detection method and device, storage medium and electronic equipment</title><author>CAI WENBIAO ; ZHANG BO ; ZHOU XIAOMING ; WANG FEI ; ZHANG YONGBIAO ; ZHANG JIAYANG ; WANG FENGJUN ; QU XIAOHU ; DONG YUNPENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115713508A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>CAI WENBIAO</creatorcontrib><creatorcontrib>ZHANG BO</creatorcontrib><creatorcontrib>ZHOU XIAOMING</creatorcontrib><creatorcontrib>WANG FEI</creatorcontrib><creatorcontrib>ZHANG YONGBIAO</creatorcontrib><creatorcontrib>ZHANG JIAYANG</creatorcontrib><creatorcontrib>WANG FENGJUN</creatorcontrib><creatorcontrib>QU XIAOHU</creatorcontrib><creatorcontrib>DONG YUNPENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAI WENBIAO</au><au>ZHANG BO</au><au>ZHOU XIAOMING</au><au>WANG FEI</au><au>ZHANG YONGBIAO</au><au>ZHANG JIAYANG</au><au>WANG FENGJUN</au><au>QU XIAOHU</au><au>DONG YUNPENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fitting defect detection method and device, storage medium and electronic equipment</title><date>2023-02-24</date><risdate>2023</risdate><abstract>The invention discloses a hardware fitting defect detection method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining an original image of a to-be-detected hardware fitting, processing the original image through a pre-trained target detection model, and obtaining a cross arm end front image and a wire end side image of the to-be-detected hardware fitting; performing edge detection on the cross arm end front image and the wire end side image to obtain cross arm end front geometric feature data and wire end side geometric feature data of the to-be-detected hardware fitting; and obtaining the wear degree of the to-be-tested fitting according to the cross arm end front geometric feature data and the wire end side geometric feature data. According to the method, the wear degree of the original image of the to-be-detected hardware fitting is identified and judged, the wear ratio of the to-be-detected hardware fitting is quantitatively calculated by using the geometr</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN115713508A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | Fitting defect detection method and device, storage medium and electronic equipment |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T21%3A41%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CAI%20WENBIAO&rft.date=2023-02-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115713508A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |