High-precision linear displacement measurement method and system
The invention discloses a high-precision linear displacement measurement method and system, and the method comprises the steps: making an information strip on the surface of a to-be-measured target, obtaining a sequence image, and carrying out the calibration, and obtaining a reference image; calibr...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a high-precision linear displacement measurement method and system, and the method comprises the steps: making an information strip on the surface of a to-be-measured target, obtaining a sequence image, and carrying out the calibration, and obtaining a reference image; calibrating the reference image to obtain a pixel position of the calibrated image and an actual physical position proportionality coefficient; in the measurement process, a real-time measurement image is obtained, coarse positioning is conducted on the position of the real-time measurement image on the reference image, fine registration is conducted on the real-time measurement image obtained after coarse positioning, and the pixel position of the real-time measurement image is obtained through calculation in combination with the pixel position of the calibration image; and obtaining a to-be-measured target measurement image, and calculating according to the pixel position of the real-time measurement image and the actu |
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