UV glue defect detection method, system, equipment and medium

The invention discloses a UV glue defect detection method, system and device and a medium, and the method comprises the following steps: setting a first light source, and obtaining a first image of a to-be-detected unit based on the first light source; setting a second light source different from th...

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Bibliographische Detailangaben
Hauptverfasser: CHENG KELIN, ZHANG ZHEN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a UV glue defect detection method, system and device and a medium, and the method comprises the following steps: setting a first light source, and obtaining a first image of a to-be-detected unit based on the first light source; setting a second light source different from the first light source, and acquiring a second image of the to-be-detected unit based on the second light source; performing element positioning operation on the first image to obtain a detection position; performing thickness detection operation based on data fitting processing on the second image according to the detection position to obtain thickness data; performing element defect detection operation based on a neural network on the second image according to the detection position to obtain defect data; judging the standard reaching condition of the to-be-detected unit based on the thickness data and the defect data; according to the invention, the integrated function of circuit board positioning, UV adhesive thi