Semiconductor chip eligibility inspection device and method
The invention belongs to the technical field of semiconductor chips, and particularly discloses a semiconductor chip qualification inspection device which comprises an inspection bin and a receiving box, a photographing device is fixedly arranged at the top of the inner side of the inspection bin, a...
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| creator | TIAN JINSHENG YANG MANNI |
| description | The invention belongs to the technical field of semiconductor chips, and particularly discloses a semiconductor chip qualification inspection device which comprises an inspection bin and a receiving box, a photographing device is fixedly arranged at the top of the inner side of the inspection bin, and a feeding mechanism is arranged at the bottom of the inner side of the inspection bin. A feeding mechanism is arranged on the rear side, close to the feeding mechanism, of the bottom of the inner side of the detection bin, the feeding mechanism comprises a sliding groove fixedly formed in the bottom of the inner side of the detection bin, and a sliding block is arranged on the inner side of the sliding groove in a sliding mode. Through cooperation of the feeding mechanism and the conveying mechanism, the semiconductor chips can be automatically fed and inspected, the inspected semiconductor chips can be automatically collected, the working efficiency of workers for inspecting the semiconductor chips is improved, |
| format | Patent |
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| language | chi ; eng |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Semiconductor chip eligibility inspection device and method |
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