Unit test method and device, electronic equipment and storage medium

The invention discloses a unit testing method and device, electronic equipment and a storage medium. The method comprises the steps that parameter description information of a pre-registered to-be-tested method is acquired; dynamically generating a parameter operation style in a specified page accor...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JANG TAEK YONG, XIE YI, HUANG CHUANMIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!