Unit test method and device, electronic equipment and storage medium

Unit test method and device, electronic equipment and storage medium

The invention discloses a unit testing method and device, electronic equipment and a storage medium. The method comprises the steps that parameter description information of a pre-registered to-be-tested method is acquired; dynamically generating a parameter operation style in a specified page accor...

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Hauptverfasser: JANG TAEK YONG, XIE YI, HUANG CHUANMIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator JANG TAEK YONG
XIE YI
HUANG CHUANMIN
description The invention discloses a unit testing method and device, electronic equipment and a storage medium. The method comprises the steps that parameter description information of a pre-registered to-be-tested method is acquired; dynamically generating a parameter operation style in a specified page according to the parameter description information; receiving a parameter value submitted by a user on a specified page; and obtaining response information of the to-be-tested method based on the parameter value for correctness verification. A user registers necessary information of a to-be-tested method in advance, so that during testing, parameter description information of the to-be-tested method is obtained from the registered necessary information, a parameter operation style is generated on a visual interface, the to-be-tested method is mapped to a front-end visual interface, the user can conveniently input parameter values on the visual interface, the testing process is simple and convenient, and the testing effi
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Unit test method and device, electronic equipment and storage medium
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